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Title	Preparation and characterization of  $^{33}$S samples for  $^{33}$S(n,$\alpha$) $^{30}$Si cross-section measurements at the n_TOF facility at CERN
Related title	Preparation and characterization of  33 S samples for  33 S(n,α) 30 Si cross-section measurements at the n_TOF facility at CERN
Author(s)	Praena, J (Granada U.) ; Ferrer, F J (CNA, Seville) ; Vollenberg, W (CERN) ; Sabaté-Gilarte, M (Seville U. ; CERN) ; Fernández, B (CNA, Seville ; Seville U.) ; García-López, J (CNA, Seville ; Seville U.) ; Porras, I (Granada U.) ; Quesada, J M (Seville U.) ; Altstadt, S (Goethe U., Frankfurt (main)) ; Andrzejewski, J (Lodz U.) ; Audouin, L (Orsay, IPN) ; Bécares, V (Madrid, CIEMAT) ; Barbagallo, M (INFN, Bari) ; Bečvář, F (Charles U.) ; Belloni, F (IRFU, Saclay) ; Berthoumieux, E (IRFU, Saclay) ; Billowes, J (Manchester U.) ; Boccone, V (CERN) ; Bosnar, D (Zagreb U., Phys. Dept.) ; Brugger, M (CERN) ; Calviño, F (Barcelona, Polytechnic U.) ; Calviani, M (CERN) ; Cano-Ott, D (Madrid, CIEMAT) ; Carrapiço, C (Lisbon, Tech. U.) ; Cerutti, F (CERN) ; Chiaveri, E (CERN ; IRFU, Saclay) ; Chin, M (CERN) ; Colonna, N (INFN, Bari) ; Cortés, G (Barcelona, Polytechnic U.) ; Cortés-Giraldo, M A (Seville U.) ; Diakaki, M (Natl. Tech. U., Athens) ; Dietz, M (Edinburgh U.) ; Domingo-Pardo, C (Valencia U., IFIC) ; Dressler, R (PSI, Villigen) ; Durán, I (Santiago de Compostela U.) ; Eleftheriadis, C (Aristotle U., Thessaloniki) ; Ferrari, A (CERN) ; Fraval, K (IRFU, Saclay) ; Furman, V (Dubna, JINR) ; Göbel, K (Frankfurt U., FIAS) ; Gómez-Hornillos, M B (Barcelona, Polytechnic U.) ; Ganesan, S (Bhabha Atomic Res. Ctr.) ; García, A R (Madrid, CIEMAT) ; Giubrone, G (Valencia U., IFIC) ; Gonçalves, I F (Lisbon, IST) ; González-Romero, E (Madrid, CIEMAT) ; Goverdovski, A (Obninsk, Inst. Phys. Power Eng.) ; Griesmayer, E (Vienna, Tech. U.) ; Guerrero, C (CERN) ; Gunsing, F (IRFU, Saclay) ; Heftrich, T (Frankfurt U., FIAS) ; Hernández-Prieto, A (CERN ; Barcelona, Polytechnic U.) ; Heyse, J (Euratom, Geel) ; Jenkins, D G (York U., England) ; Jericha, E (Vienna, Tech. U.) ; Käppeler, F (Karlsruhe U.) ; Kadi, Y (CERN) ; Karadimos, D (Natl. Tech. U., Athens) ; Katabuchi, T (Tokyo Inst. Tech.) ; Ketlerov, V (Obninsk, Inst. Phys. Power Eng.) ; Khryachkov, V (Obninsk, Inst. Phys. Power Eng.) ; Kivel, N (PSI, Villigen) ; Koehler, P (ORNL, Oak Ridge (main)) ; Kokkoris, M (Natl. Tech. U., Athens) ; Kroll, J (Charles U.) ; Krtička, M (Charles U.) ; Lampoudis, C (IRFU, Saclay) ; Langer, C (Goethe U., Frankfurt (main)) ; Leal-Cidoncha, E (Santiago de Compostela U.) ; Lederer, C (Vienna U.) ; Leeb, H (Vienna, Tech. U.) ; Leong, L S (Orsay, IPN) ; Lerendegui-Marco, J (Seville U.) ; Losito, R (CERN) ; Mallick, A (Bhabha Atomic Res. Ctr.) ; Manousos, A (Aristotle U., Thessaloniki) ; Marganiec, J (Lodz U.) ; Martínez, T (Madrid, CIEMAT) ; Massimi, C (Bologna U. ; INFN, Bologna) ; Mastinu, P (INFN, Legnaro) ; Mastromarco, M (INFN, Bari) ; Mendoza, E (Madrid, CIEMAT) ; Mengoni, A (ENEA, Bologna) ; Milazzo, P M (INFN, Trieste) ; Mingrone, F (INFN, Bologna) ; Mirea, M (Bucharest, IFIN-HH) ; Mondelaers, W (Euratom, Geel) ; Paradela, C (Santiago de Compostela U.) ; Pavlik, A (Vienna U.) ; Perkowski, J (Lodz U.) ; Plompen, A J M (Euratom, Geel) ; Rauscher, T (Basel U.) ; Reifarth, R (Frankfurt U., FIAS) ; Riego-Perez, A (Barcelona, Polytechnic U.) ; Robles, M (U. Santiago de Compostela (main)) ; Rubbia, C (CERN) ; Ryan, J A (Manchester U.) ; Sarmento, R (Lisbon, IST) ; Saxena, A (Bhabha Atomic Res. Ctr.) ; Schillebeeckx, P (Euratom, Geel) ; Schmidt, S (Frankfurt U., FIAS) ; Schumann, D (PSI, Villigen) ; Sedyshev, P (Dubna, JINR) ; Tagliente, G (INFN, Bari) ; Tain, J L (Valencia U., IFIC) ; Tarifeño-Saldivia, A (Valencia U., IFIC) ; Tarrío, D (Santiago de Compostela U.) ; Tassan-Got, L (Orsay, IPN) ; Tsinganis, A (CERN) ; Valenta, S (Charles U.) ; Vannini, G (Bologna U. ; INFN, Bologna) ; Variale, V (INFN, Bari) ; Vaz, P (Lisbon, IST) ; Ventura, A (INFN, Bologna) ; Vermeulen, M J (York U., England) ; Vlachoudis, V (CERN) ; Vlastou, R (Natl. Tech. U., Athens) ; Wallner, A (Australian Natl. U., Canberra) ; Ware, T (Manchester U.) ; Weigand, M (Frankfurt U., FIAS) ; Weiss, C (Vienna, Tech. U.) ; Wright, T (Manchester U.) ; Žugec, P (Zagreb U., Phys. Dept.)
Collaboration	n_TOF
Publication	2018
Number of pages	6
In:	Nucl. Instrum. Methods Phys. Res., A 890 (2018) 142-147
DOI	10.1016/j.nima.2018.02.055
Subject category	Detectors and Experimental Techniques
Accelerator/Facility, Experiment	CERN PS ; nTOF
Abstract	Thin  33 S samples for the study of the  33 S(n, α ) 30 Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of  33 S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of  33 S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Copyright/License	The Authors publication: (License: CC-BY-NC-ND 4.0)

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