High-precision efficiency calibration of a high-purity co-axial germanium detector
Authors:
B. Blank,
J. Souin,
P. Ascher,
L. Audirac,
G. Canchel,
M. Gerbaux,
S. Grevy,
J. Giovinazzo,
H. Guerin,
T. Kurtukian Nieto,
I. Matea,
H. Bouzomita,
P. Delahaye,
G. F. Grinyer,
J. C. Thomas
Abstract:
A high-purity co-axial germanium detector has been calibrated in efficiency to a precision of about 0.15% over a wide energy range. High-precision scans of the detector crystal and gamma-ray source measurements have been compared to Monte-Carlo simulations to adjust the dimensions of a detector model. For this purpose, standard calibration sources and short-lived on-line sources have been used. Th…
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A high-purity co-axial germanium detector has been calibrated in efficiency to a precision of about 0.15% over a wide energy range. High-precision scans of the detector crystal and gamma-ray source measurements have been compared to Monte-Carlo simulations to adjust the dimensions of a detector model. For this purpose, standard calibration sources and short-lived on-line sources have been used. The resulting efficiency calibration reaches the precision needed e.g. for branching ratio measurements of super-allowed beta decays for tests of the weak-interaction standard model.
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Submitted 4 April, 2014;
originally announced April 2014.
Precise half-life measurement of the 26Si ground state
Authors:
I. Matea,
J. Souin,
J. Aysto,
B. Blank,
P. Delahaye,
V. -V. Elomaa,
T. Eronen,
J. Giovinazzo,
U. Hager,
J. Hakala,
J. Huikari,
A. Jokinen,
A. Kankainen,
I. D. Moore,
J. -L. Pedroza,
S. Rahaman,
J. Rissanen,
J. Ronkainen,
A. Saastamoinen,
T. Sonoda,
C. Weber
Abstract:
The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previ…
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The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
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Submitted 7 August, 2008; v1 submitted 27 January, 2008;
originally announced January 2008.