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Femtosecond Electron Diffraction and its Application for Beam Characterization at the PAL / Xiang, Dao ; Ihee, Hyotcherl ; Park, Sung-Ju ; Soo Ko In ; Wang, Xijie
Electron diffraction is widely used in electron microscopy to obtain ultrahigh magnification factor, or crystallography to determine the internal structure of the molecule. High energy electron (MeV) has been used to probe the solid state thick sample, now being explored for femto-second electron diffraction (FED) to determine the transient structure of the molecule. [...]
2005 External link: Published version from JACoW
In : 21st IEEE Particle Accelerator Conference, Knoxville, TN, USA, 16 - 20 May 2005, pp.3721

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