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CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
/ Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Costantino, Alessandra (ESTEC, Noordwijk) ; Coronetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew Alexander (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Johnson, Eliott Philippe (CERN) et al.
We present the progress related to CERN’s capacity of delivering highly penetrating, high-linear energy transfer (LET) heavy ions for radiation effect testing of electronic components within the CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations, and a 300- $\mu $ m-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1549-1556
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A Radiation-Tolerant 25.6-Gb/s High-Speed Transmitter in 28-nm CMOS With a Tolerance of 1 Grad
/ Klekotko, A (CERN ; Leuven U.) ; Biereigel, S (CERN) ; Baszczyk, M (CERN) ; Moreira, P (CERN) ; Martina, F (CERN) ; Prinzie, J (Leuven U.) ; Kulis, S (Leuven U.)
This article presents a 25.6-Gbit $\cdot $ s−1 high-speed transmitter (HST) manufactured using 28-nm CMOS technology. The HST macroblock includes an all-digital phase-locked loop (ADPLL), duty cycle corrector (DCC) circuit, data pattern generator, serializer, and a driver capable of driving the differential 100- $\Omega $ line as well as a silicon photonics (SiPh) ring modulator (RM). [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 2124-2132
Fulltext: PDF;
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
/ Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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4.
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LET Calibration of Ion Microbeams and Their SEE Cross Section Characterization
/ Peracchi, Stefania (ANSTO, Menai) ; Drury, Ryan (ANSTO, Menai) ; Pastuovic, Zeljko (ANSTO, Menai) ; Williams, Jesse (Wollongong U.) ; Tran, Linh T (Wollongong U.) ; Guatelli, Susanna (Wollongong U.) ; Pan, Vladimir (Wollongong U.) ; Archer, Jay W (Wollongong U.) ; Rosenfeld, Anatoly B (Wollongong U.) ; Coronetti, Andrea (CERN) et al.
The Australian Nuclear Science and Technology Organisation hosts the Center for Accelerator Science, a sovereign facility with light and heavy ion beams. The 10-MV ANTARES accelerator is equipped with one of the few heavy ion nuclear microprobes in the world, which has been upgraded with the unique external beam irradiation facility (EBIF). [...]
2024 - 6 p.
- Published in : IEEE Trans. Nucl. Sci.
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1565-1570
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5.
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Sacristan Barbero, Mario (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Aguiar, Ygor Q (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Danzeca, Salvatore (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Hands, Alex (TRIUMF) et al.
We present a calibration of a commercial silicon diode with proton and alpha beams and gamma rays. The diode together with a fast acquisition chain can be exploited for both direct and indirect (through the secondary radiation field) beam characterization. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 777-784
Fulltext: PDF;
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An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs
/ Coronetti, Andrea (CERN ; Montpellier U.) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Kastriotou, Maria ; Cazzaniga, Carlo ; Frost, Christopher D ; Saigné, Frédéric (Montpellier U.)
The thermal neutron threat to the reliability of electronic devices caused by $^{10}\text{B}$ capture is a recognized issue that prompted changes in the manufacturing process of electronic devices with the aim of limiting as much as possible the presence of this isotope nearby device sensitive volumes (SVs). $^{14}\text{N}$ can also capture thermal neutrons and release low-energy protons (LEPs; through the $^{14}\text{N}$ (n, p) $^{14}\text{C}$ reaction) that have high enough linear energy transfer (LET) to cause single-event upsets (SEUs). [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1634-1642
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Industry Collaboration with Large Research Infrastructures: What factors influence knowledge benefits for companies?
/ Magazinik, Anastasiya (Tampere U.) ; Lasheras, Nuria Catalan (CERN) ; Mäkinen, Saku (Tampere U.) ; Bedolla, Joel Sauza (Lancaster U. (main))
Firms' collaboration with large research infrastructure through procurement activities during the construction phase of a large-scale scientific experiment, has been previously shown to enhance suppliers' performance. The present work assesses the industry collaboration with CERN, the European Organization for Nuclear Research, for the international study on a future particle accelerator for high energy physics, the Compact Linear Collider (CLIC study). [...]
2021 - 7 p.
- Published in : 10.1109/ICE/ITMC52061.2021.9570210
In : 2021 IEEE International Conference on Engineering, Technology and Innovation (ICE/IEEE ITMC 2021), Cardiff, UK, 21 - 23 Jun 2021
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