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CERN Document Server 找到 5 筆記錄  檢索需時 0.59 秒. 
1.
Radiation test of commercial of the shelf (COTS) optical transceivers in the frame of the beam position monitor (BPM) consolidation project for the Large Hadron Collider (LHC) / Marin, M Barros (CERN) ; Boccardi, A (CERN) ; Ozdogan, S Can (CERN) ; Danzeca, S (CERN) ; Ferraro, R (CERN) ; Scialdone, A (CERN)
The consolidation of the Large Hadron Collider (LHC) beam position monitor (BPM) requires the deployment of about 5000 single-mode radiation-tolerant optical transmitters, working at 10 Gbps during 20 years of operation. While the use of the custom devices being designed at CERN remains the baseline for the project, 8 commercial of the shelf (COTS) optical transceivers have been evaluated as an alternative. [...]
2024 - 9 p. - Published in : JINST 19 (2024) C03040 Fulltext: PDF;
In : Topical Workshop on Electronics for Particle Physics 2023 (TWEPP 2023), Geremeas, Sardinia, Italy, 1 - 6 Oct 2023, pp.C03040
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2.
CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications / Scialdone, A (CERN ; IES, Montpellier) ; Gkountoumis, P (CERN ; UC, Irvine) ; Ferraro, R (CERN) ; Barros Marin, M (CERN) ; Dilillo, L (IES, Montpellier) ; Saigne, F (IES, Montpellier) ; Boch, J (IES, Montpellier) ; Danzeca, S (CERN) ; Masi, A (CERN)
The CHARM Radiation Tolerant FPGA Tester Board (CRaTeBo) isa FPGA testing platform for the CERN High-energy Accelerator (CHARM)irradiation facility. It is meant to ease the radiation testing ofFPGA-based systems by providing users with a radiation-tolerantcarrier card featuring an FPGA interface, a high-speed communicationinterface, a flexible power supply, and an HPC-FMC connector foradditional front-end electronics. [...]
2024 - 11 p. - Published in : JINST 19 (2024) P01012 Fulltext: PDF;
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3.
2023 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator / Ferraro, Rudy (CERN) ; Gkountoumis, Panagiotis (CERN) ; Foucard, Gilles (CERN) ; Ventura, Antonio (CERN) ; Scialdone, Antonio (CERN ; Montpellier U.) ; Zimmaro, Alessandro (CERN ; Montpellier U.) ; Glecer, Bruno (CERN) ; Koseoglou, Sokratis (CERN) ; Botias, Cai Arcos (CERN) ; Masi, Alessandro (CERN) et al.
The sensitivity of a variety of components for particle accelerator electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital, and mixed devices..
2023 - 8 p. - Published in : 10.1109/REDW61050.2023.10265814
In : 2023 IEEE Radiation Effects Data Workshop (REDW 2023): (in conjunction with 2023 NSREC), Kansas City, Missouri, United States, 24 - 28 Jul 2023
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4.
Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF Metrics / Scialdone, Antonio (CERN ; LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Ferraro, Rudy (cern) ; Dilillo, Luigi (LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Saigne, Frederic (Montpellier U. ; CNRS, France) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
This article describes how to analyze radiation-induced effects using traditional radio-frequency (RF) metrics in RF integrated circuits (RFICs) to be used in the implementation of software-defined radios (SDRs). The impacts of total ionizing dose (TID) and single-event effects (SEEs) on the device characteristics are shown and their consequences for an SDR are discussed. [...]
2023 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.2068-2075
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5.
FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits / Scialdone, Antonio (CERN ; Polytech. Turin) ; Ferraro, Rudy (CERN) ; Garcia Alia, Ruben (CERN) ; Sterpone, Luca (Polytech. Turin) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN)
When studying the behavior of a field programmable gate array (FPGA) under radiation, the most commonly used methodology consists in evaluating the single-event effect (SEE) cross section of its elements individually. However, this method does not allow the estimation of the device failure rate when using a custom design. [...]
2022 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1633-1641 Fulltext: PDF;
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