CERN Accelerating science

CERN Document Server 10 ჩანაწერია ნაპოვნი  ძიებას დასჭირდა 0.79 წამი. 
1.
Radiation Monitoring and Performance of Electronic Systems in High-Energy Accelerator Radiation Environments / Söderström, Daniel (CERN) ; Aguiar, Ygor (CERN ; Jean Monnet U.) ; Biłko, Kacper (CERN) ; Canesse, Auriane (CERN) ; Lerner, Giuseppe (CERN) ; Prelipcean, Daniel (CERN ; Tech. U., Munich (main)) ; Alía, Rubén García (CERN)
Electronic systems distributed along high-energy particle accelerators need rigorous radiation hardness qualifications to ensure adequate availability of the beam. This work presents the radiation levels on a distributed system, featuring a commercial Cypress 90-nm memory, which is deployed around the Large Hadron Collider (LHC), the largest accelerator within the European Organization for Nuclear Research (CERN). [...]
2025 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2490-2497 Fulltext: PDF; External link: Fulltext
2.
The HEARTS EU Project and Its Initial Results on Fragmented High-Energy Heavy-Ion Single-Event Effects Testing / García Alía, Rubén (CERN) ; Waets, Andreas (CERN ; Zurich U.) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Bilko, Kacper (CERN ; Jean Monnet U.) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Fraser, Matthew (CERN) ; Johnson, Eliott (CERN) ; Klimek, Karolina (CERN) et al.
We perform single-event effect (SEE) tests with well-characterized fully fragmented (i.e., beyond Bragg peak) high-energy heavy-ion beams and compare the results with those expected from conventional, mono-linear energy transfer (mono-LET) measurements, showing a satisfactory level of agreement between the two. This compliance paves the way for the exploitation of simulation tools for accurately quantifying the ion fragmentation impact on SEE rates for both ground-level testing conditions and space galactic cosmic-ray (GCR) environments, with electronics operating behind significant thicknesses of shielding. [...]
2025 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1040-1049 Fulltext: PDF;
3.
Radiation levels in the LHC tunnel and impact on electronics during the 2023 Pb ion run / Canesse, Auriane (CERN) ; Ricci, Daniel (CERN) ; Söderström, Daniel (CERN) ; Di Francesca, Diego (CERN) ; Tagkoudi, Eirini (CERN) ; Cerutti, Francesco (CERN) ; Lerner, Giuseppe (CERN) ; Garcia Alia, Ruben (CERN) ; Fiore, Salvatore (CERN) ; Niang, Samuel (CERN)
The 2023 operation of the Large Hadron Collider (LHC) at CERN included a one-month-long run with fully stripped Pb ion beams, marking the first heavy-ion run since 2018, and delivering Pb ion collisions at an unprecedented center-of-mass energy of 5.36 TeV per nucleon pair. During this period, the radiation fields in the LHC tunnel have been measured by means of different radiation monitors, including Beam Loss Monitors (BLMs), RadMons, and distributed optical fiber dosimeters, with the primary goal of quantifying the radiation exposure of electronic systems. [...]
2024 - 4 p. - Published in : JACoW IPAC 2024 (2024) THPG42 Fulltext: PDF;
In : 15th International Particle Accelerator Conference (IPAC 2024), Nashville, TN, United States, 19 - 24 May 2024, pp.THPG42
4.
LHC Oxygen Run Preparation in the CERN Injector Complex / Slupecki, Maciej (CERN) ; Aguglia, Davide (CERN) ; Aguiar, Ygor (Universite Jean Monnet (FR)) ; Alemany Fernandez, Reyes (CERN) ; Argyropoulos, Theodoros (CERN) ; Barlow, Roger Andrew (CERN) ; Bartosik, Hannes (CERN) ; Bellodi, Giulia (CERN) ; Bilko, Kacper (Universite Jean Monnet (FR)) ; Borburgh, Jan (CERN) et al.
The Ion Accelerator Complex, composed of a linear accelerator (Linac3) and a chain of synchrotrons (Low Energy Ion Ring: LEIR, Proton Synchrotron: PS, Super Proton Synchrotron: SPS and the Large Hadron Collider: LHC) will operate oxygen ion beams for Oxygen–Oxygen (O–O) and proton–Oxygen (p–O) collisions in the LHC in Run 3. [...]
CERN-ACC-NOTE-2024-0001.
- 2024. - 29 p.
Full text
5.
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM / Luza, Lucas Matana (LIRMM, Montpellier) ; Soderstrom, Daniel (Jyvaskyla U.) ; Puchner, Helmut (Unlisted, US) ; Alia, Ruben Garcia (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Bosio, Alberto (Lyon, Ecole Centrale) ; Dilillo, Luigi (LIRMM, Montpellier)
In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and singlebit upsets..
2020 - 6 p. - Published in : 10.1109/dtis48698.2020.9080918
In : 15th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Marrakesh, Morocco, 1 - 3 Apr 2020, pp.1-6
6.
Gd$^{3+}$-doped sol-gel silica glass for remote ionizing radiation dosimetry / El hamzaoui, Hicham (Lille U. ; PhLAM, Villeneuve d'Ascq) ; Bouwmans, Géraud (Lille U. ; PhLAM, Villeneuve d'Ascq) ; Capoen, Bruno (Lille U. ; PhLAM, Villeneuve d'Ascq) ; Cassez, Andy (Lille U. ; PhLAM, Villeneuve d'Ascq) ; Habert, Rémi (Lille U. ; PhLAM, Villeneuve d'Ascq) ; Ouerdane, Youcef (Lyon U.) ; Girard, Sylvain (Lyon U.) ; Di Francesca, Diego (CERN) ; Kerboub, Nourdine (CERN) ; Morana, Adriana (Lyon U.) et al.
Gadolinium-doped silica glass was prepared, using the sol-gel route, for ionizing radiation dosimetry applications. Such a glassy rod was drawn to a cane at a temperature of 2000 °C. [...]
2019 - 7 p. - Published in : OSA Continuum 2 (2019) 715-721 Fulltext from publisher: PDF;
7.
The Pion Single-Event Latch-Up Cross Section Enhancement: Mechanisms and Consequences for Accelerator Hardness Assurance / Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Alia, Ruben Garcia (CERN) ; Cerutti, Francesco (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Soderstrom, Daniel (Jyvaskyla U.) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U. (main)) ; Saigne, Frederic (Montpellier U.)
Pions make up a large part of the hadronic environment typical of accelerator mixed fields. Characterizing device cross sections against pions is usually disregarded in favor of tests with protons, whose single-event latch-up (SEL) cross section is, nonetheless, experimentally found to be lower than that of pions for all energies below 250 MeV. [...]
2021 - 10 p. - Published in : IEEE Trans. Nucl. Sci. 68 (2021) 1613-1622 Fulltext: PDF;
8.
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment / Söderström, Daniel (Jyvaskyla U.) ; Matana Luza, Lucas (Montpellier U.) ; Kettunen, Heikki (Jyvaskyla U.) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U.) ; Farabolini, Wilfrid (CERN ; Saclay) ; Gilardi, Antonio (CERN ; Naples U. ; INFN Naples) ; Coronetti, Andrea (Jyvaskyla U. ; CERN) ; Poivey, Christian (ESTEC, Noordwijk) ; Dilillo, Luigi (Montpellier U.)
This study investigates the response of synchronous dynamic random access memories to energetic electrons and especially the possibility of electrons to cause stuck bits in these memories. Three different memories with different node sizes (63, 72, and 110 nm) were tested. [...]
2021 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 68 (2021) 716-723
9.
Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation / Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Garcia Alia, Ruben (CERN) ; Budroweit, Jan (DLR, Bremen) ; Rajkowski, Tomasz (Unlisted, FR) ; Da Costa Lopes, Israel (IES, Montpellier) ; Niskanen, Kimmo (IES, Montpellier) ; Soderstrom, Daniel (Jyvaskyla U.) ; Cazzaniga, Carlo (Rutherford) ; Ferraro, Rudy (CERN) ; Danzeca, Salvatore (CERN) et al.
2021 - 12 p. - Published in : IEEE Trans. Nucl. Sci. 68 (2021) 958-969
10.
The Pion Single-Event Effect Resonance and its Impact in an Accelerator Environment / Coronetti, Andrea (CERN) ; García Alía, Rubén (CERN) ; Cecchetto, Matteo (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Söderström, Daniel (Jyvaskyla U.) ; Javanainen, Arto (Jyvaskyla U.) ; Saigné, Frédéric (Montpellier U.)
The pion resonance in the nuclear reaction cross section is seen to have a direct impact on the single-event effect (SEE) cross section of modern electronic devices. This was experimentally observed for single-event upsets and single-event latchup. [...]
2020 - 8 p. - Published in : IEEE Trans. Nucl. Sci. 67 (2020) 1606-1613 Fulltext from publisher: PDF;

ასევე იხილეთ: მსგავსი ავტორის სახელები
9 Soderstrom, Daniel
1 Soderstrom, Daniel Paul
1 Söderström, D
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