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1.
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Analysis of the Thermal Annealing Regeneration Process of RPL Dosimeters for High Dose Levels
/ Aguiar, Y Q (CERN ; Jean Monnet U.) ; García Alía, R (CERN) ; Ferrari, M (Jean Monnet U.) ; Hasan, A (Unlisted, NO) ; Perrot, J (Jean Monnet U.) ; Mandal, A Raj (Jean Monnet U.) ; Girard, S (Jean Monnet U. ; IUF, Paris)
This work provides the analysis of two thermal
treatments for the annealing regeneration process of radio-
photoluminescent dosimeters (RPLDs) used in high-level dose
measurements. After regeneration, dosimeter sensitivity was
assessed through several irradiation campaigns, with doses reach-
ing up to 500 kGy using 60Co gamma radiation and X-rays with
an energy spectrum up to 100 keV. [...]
2025 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2527-2535
Fulltext: PDF; External link: Fulltext
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2.
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Microdosimetry of Very-High-Energy Heavy Ion Beams for Electronics Testing Using Silicon-on-Insulator Detectors
/ Waets, Andreas (CERN ; U. Zurich (main)) ; Emriskova, Natalia (CERN) ; Garcia Alia, Ruben (CERN) ; Klimek, Karolina (CERN) ; Pan, Vladimir (Wollongong U.) ; Rosenfeld, Anatoly (Wollongong U.) ; Tran, Linh T (Wollongong U.) ; Vohradsky, James (Wollongong U.) ; Kok, Angela (SINTEF, Oslo) ; Povoli, Marco (SINTEF, Oslo) et al.
This article explores the use of microdosimetry with
a silicon-on-insulator (SOI) detector for characterizing very-high-
energy (VHE) heavy ion beams used specifically for single event
effect (SEE) testing of electronics. The detector was deployed
at CERN’s heavy ion facility for radiation effects testing and
exposed to lead ion beams in the 100–1000 MeV per nucleon
kinetic energy range. [...]
2025 - 6 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2513-2518
Fulltext: PDF; External links: Fulltext; Fulltext
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3.
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Beam delivery of high-energy ion beams for irradiation experiments at the CERN Proton Synchrotron
/ Johnson, Eliott (CERN) ; Waets, Andreas (CERN) ; Imesch, Gil (CERN) ; Bilko, Kacper (CERN) ; Delrieux, Marc (CERN) ; Fraser, Matthew (CERN) ; Emriskova, Natalia (CERN) ; Arrutia Sota, Pablo Andreas (CERN) ; Garcia Alia, Ruben (CERN) ; Bass, Thomas (CERN)
Heavy-ion single event effect (SEE) test facilities are critical in the development of microelectronic components that will be exposed to the ionizing particles present in the hostile environment of space. CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) and HEARTS have developed a high-energy ion beam capable of scanning a wide range of Linear Energy Transfer (LET) at low intensities to study ionization effects on space-bound technology using CERN's Proton Synchrotron (PS). [...]
2023 - 4 p.
- Published in : JACoW IPAC 2023 (2023) MOPA115
Fulltext: PDF;
In : 14th International Particle Accelerator Conference (IPAC 2023), Venice, Italy, 7 - 12 May 2023, pp.MOPA115
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4.
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Overview of the radiation levels in the CERN accelerator complex after LS2
/ Canesse, Auriane (CERN) ; Zimmaro, Alessandro (CERN) ; Prelipcean, Daniel (CERN) ; Ricci, Daniel (CERN) ; Di Francesca, Diego (CERN) ; Lerner, Giuseppe (CERN) ; Garcia Alia, Ruben (CERN) ; Danzeca, Salvatore (CERN)
The PSB, PS, and SPS accelerators at CERN provide high-energy proton and ion beams to a wide range of experiments, from fixed targets to the world’s biggest particle accelerator: the Large Hadron Collider (LHC). In 2021 and 2022, their beams have reached unprecedented intensities thanks to the LHC Injectors Upgrade (LIU) undertaken during the Long Shutdown 2 (LS2) in preparation of the High-Luminosity (HL) LHC era. [...]
2023 - 4 p.
- Published in : JACoW IPAC 2023 (2023) THPA046
Fulltext: PDF;
In : 14th International Particle Accelerator Conference (IPAC 2023), Venice, Italy, 7 - 12 May 2023, pp.THPA046
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5.
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SRAM-based heavy ion beam flux and LET dosimetry
/ Coronetti, Andrea (CERN ; IES, Montpellier) ; García-Alía, Rubén (CERN) ; Dilillo, Luigi (LIRMM, Montpellier) ; Imianosky, Carolina (IES, Montpellier) ; Dos Santos, Douglas Almeida (IES, Montpellier) ; Luza, Lucas Matana (LIRMM, Montpellier ; SENAI/CETIQT, Rio de Janeiro) ; Bosser, Alexandre (LIRMM, Montpellier ; Unlisted, FR) ; Bilko, Kacper (CERN) ; Waers, Andreas (CERN) ; Klimek, Karolina (CERN) et al.
This paper explores the possibility of enhancing the capability of static random access memories (SRAMs) as heavy ion beam detectors starting from the multiple-cell upsets (MCUs) measured in some well characterized beams. In particular, the two main enablers brought by the MCU analysis are (1) the determination of the beam flux even when the LET of the beam is not known [whenever the LET is > 10 MeV/(mg/cm2)] and (2) the estimation of the LET of the heavy ion beam without reliance on any other instrument [...]
2024 - 8 p.
- Published in : 10.1109/tns.2024.3487647
Fulltext: PDF;
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6.
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7.
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RPP Model Trends Across Technology Nodes for the MC Simulation of SEUs in Commercial Bulk Planar CMOS SRAMs Under Proton Irradiation
/ Şerban, Alexandra-Gabriela (CERN ; Bucharest U. ; Bucharest, IFIN-HH) ; Coronetti, Andrea (CERN ; IES, Montpellier ; Unlisted, DE) ; García Alía, Rubén (CERN) ; Salvat-Pujol, Francesc (CERN)
The ubiquitous use of electronic devices in high-radiation environments requires robust methods for assessing and improving their resilience against single-event effects (SEEs) and, especially, single-event upsets (SEUs). In this study, SEU production induced by protons below 500 MeV in three commercial bulk planar static random access memories (SRAMs) manufactured on different standard CMOS technology nodes (from 250 to 40 nm) is investigated employing the Monte Carlo (MC) particle-transport code FLUKA. [...]
2025 - 14 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 133-146
Fulltext: PDF;
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8.
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Characterization of Fully Fragmented High-Energy Heavy-Ion Beams for SEE Testing Through Measurements and Simulations
/ Waets, Andreas (CERN ; U. Zurich (main)) ; García Alía, Rubén (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Salvatore Esposito, Luigi (CERN) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Nieminen, Petteri (ESA) ; Schneider, Uwe (U. Zurich (main))
Fully fragmented, very-high-energy (VHE) heavy-ion beams offer interesting possibilities for radiation hardness assurance testing of electronic components exposed to the Galactic Cosmic Ray (GCR) space environment. In this article, we perform the dosimetry of these fully fragmented ion beams through a combination of silicon solid-state detector measurements and detailed Monte Carlo (MC) simulations in FLUKA focusing on the interaction between the beam and the device under test. [...]
2025 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1123-1129
Fulltext: PDF;
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9.
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The HEARTS EU Project and Its Initial Results on Fragmented High-Energy Heavy-Ion Single-Event Effects Testing
/ García Alía, Rubén (CERN) ; Waets, Andreas (CERN ; Zurich U.) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Bilko, Kacper (CERN ; Jean Monnet U.) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Fraser, Matthew (CERN) ; Johnson, Eliott (CERN) ; Klimek, Karolina (CERN) et al.
We perform single-event effect (SEE) tests with well-characterized fully fragmented (i.e., beyond Bragg peak) high-energy heavy-ion beams and compare the results with those expected from conventional, mono-linear energy transfer (mono-LET) measurements, showing a satisfactory level of agreement between the two. This compliance paves the way for the exploitation of simulation tools for accurately quantifying the ion fragmentation impact on SEE rates for both ground-level testing conditions and space galactic cosmic-ray (GCR) environments, with electronics operating behind significant thicknesses of shielding. [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1040-1049
Fulltext: PDF;
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