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MACHINA, the Movable Accelerator for Cultural Heritage In-situ Non-destructive Analysis: project overview / Taccetti, F (INFN, Florence) ; Castelli, L (INFN, Florence) ; Chiari, M (INFN, Florence) ; Czelusniak, C (INFN, Florence) ; Falciano, S (INFN, Rome ; GSSI, Aquila) ; Fedi, M (INFN, Florence) ; Giambi, F (INFN, Florence ; Florence U.) ; Mandò, P A (INFN, Florence ; Florence U.) ; Manetti, M (INFN, Florence) ; Massi, M (INFN, Florence) et al.
Over the years, transportable instrumentation for cultural heritage (CH) in situ measurements has noticeably widespread, due to logistic, economical and safety reasons. Ion beam analysis, a powerful set of analytical techniques, of great importance for CH, is instead carried out by using fixed instrumentation. [...]
2023 - 19 p. - Published in : Rend. Lincei Sci. Fis. Nat. 34 (2023) 427-445 Fulltext: PDF;

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The CERN PIXE-RFQ, a transportable proton accelerator for the machina project / Mathot, S (CERN) ; Anelli, G (CERN) ; Atieh, S (CERN) ; Bilton, A (CERN) ; Bulat, B (CERN) ; Callamand, Th (CERN) ; Calvo, S (CERN) ; Favre, G (CERN) ; Geisser, J -M (CERN) ; Gerardin, A (CERN) et al.
CERN has been building a transportable RFQ for use in the examination of art masterpieces based mainly on the PIXE (Proton Induced X-ray Emission) technique with an extracted beam. This new PIXE-RFQ accelerator is very compact, only one meter in length with a power consumption of less than 6 kVA for a beam energy of 2 MeV and an average current of 5 nA. [...]
2019 - 5 p. - Published in : Nucl. Instrum. Methods Phys. Res., B 459 (2019) 153-157

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Use of micro-PIXE analysis for the identification of contaminants in the metal deposition on a CMS pitch adapter / Massi, M ; Giuntini, L ; Fedi, M E ; Arilli, C ; Grassi, N ; Mando, P A ; Migliori, A ; Focardi, E
In the silicon tracker for the Compact Muon Solenoid experiment at the forthcoming Large Hadron Collider of CERN, each silicon sensor is connected to the front-end electronics by a pitch adapter, the structure of which consists of a fan of very thin chromium strips coated with a few microns aluminium deposition, on a glass support. The absence of contaminants in the depositions is of crucial importance for the electrical and mechanical reliability of the micro-bonding connections. [...]
2004 - Published in : Nucl. Instrum. Methods Phys. Res., B 219-220 (2004) 722-726

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