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Online X-Ray Radiation Induced Attenuation of RPL Dosimeters: Dose Rate Dependence at High Doses
/ Mandal, A Raj (Jean Monnet U.) ; Ferrari, M (Jean Monnet U.) ; Aguiar, Y Q (Jean Monnet U. ; CERN) ; Morana, A (Jean Monnet U.) ; Alía, R García (CERN) ; Hasan, A (Jean Monnet U. ; Unlisted, NO) ; Marin, E (Jean Monnet U.) ; Ouerdane, Y (Jean Monnet U.) ; Boukenter, A (Jean Monnet U.) ; Girard, S (Jean Monnet U. ; IUF, Paris)
Monitoring radiation levels accurately in high-dose environments is essential, particularly as the need for dose monitoring in the kGy-MGy range increases. Most dosimetry techniques are not reliable at these dose levels, necessitating the exploration of alternative methods. [...]
2025 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2021-2028
Fulltext: PDF;
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2.
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Real-Time SER Measurements of CMOS Bulk 40- and 65-nm SRAMs Combined With Neutron Spectrometry at the JET Tokamak During Its Final D-T Plasma Operation
/ Dentan, Martin (CEA Cadarache ; CERN) ; Moindjie, Soilihi (CNRS, France) ; Cecchetto, Matteo (CERN) ; Autran, Jean-Luc (CNRS, France) ; Alia, Rubén Garcia (CERN) ; Naish, Richard (Culham Lab) ; Waterhouse, John (Culham Lab) ; Horton, Alan R (Culham Lab) ; Litaudon, Xavier (CEA Cadarache) ; Munteanu, Daniela (CNRS, France) et al.
We performed soft error rate (SER) characterization of 40- and 65-nm bulk CMOS static random access memories (SRAMs) combined with neutron spectrometry in the deuterium-tritium (D-T)-fueled Joint European Torus (JET) tokamak during its final D-T plasma operation (September and October 2023) producing a series of several dozens of power pulses. Our experimental results demonstrate the impact of machine operation on the electronics’ reliability, emulating realistic conditions for circuits exposed to the partially radiation-shielded environment of future fusion reactors. [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1486-1495
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3.
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Dose Rate Effects in Ag-Doped Metaphosphate Glass Radiophotoluminescent Dosimeters Up to MGy Range
/ Aguiar, Y Q (CERN ; Jean Monnet U.) ; Alía, R García (CERN) ; Kranjčević, M (CERN) ; Cecchetto, M (CERN) ; Söderström, D (CERN) ; Mandal, A Raj (Jean Monnet U.) ; Gascon, J (CERN) ; Trummer, J (CERN) ; Vincke, H (CERN) ; Alessi, A (Ec. Polytech., Palaiseau (main)) et al.
2025 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2570-2577
Fulltext: PDF; External links: Fulltext; Fulltext
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4.
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Energy Deposition and Characterization of Single-Event Upset and Latch-Up Cross Sections With 14 MeV and Thermal Neutrons
/ Cecchetto, Matteo (CERN) ; Alía, Rubén García (CERN) ; Lerner, Giuseppe (CERN) ; Bilko, Kacper (CERN) ; Pujol, Francesc Salvat (CERN) ; Vlachoudis, Vasilis (CERN) ; Cerutti, Francesco (CERN)
Single-event latch-up (SEL) cross sections of static random access memory (SRAM) at high energy (100–200 MeV)
are generally not reproducible with 14-MeV neutrons, differently to single-event upset (SEU) cross sections. We explain
this phenomenon through Monte Carlo simulations, analyzing neutron–silicon interactions and the indirect energy deposition
in sensitive volumes (SVs) resembling the two mechanisms, showing that the former approach is not sufficient to explain
how the energy is deposited [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2847-2856
Fulltext: PDF; External link: Fulltext
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5.
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Radiation Monitoring and Performance of Electronic Systems in High-Energy Accelerator Radiation Environments
/ Söderström, Daniel (CERN) ; Aguiar, Ygor (CERN ; Jean Monnet U.) ; Biłko, Kacper (CERN) ; Canesse, Auriane (CERN) ; Lerner, Giuseppe (CERN) ; Prelipcean, Daniel (CERN ; Tech. U., Munich (main)) ; Alía, Rubén García (CERN)
Electronic systems distributed along high-energy particle accelerators need rigorous radiation hardness qualifications to ensure adequate availability of the beam. This work presents the radiation levels on a distributed system, featuring a commercial Cypress 90-nm memory, which is deployed around the Large Hadron Collider (LHC), the largest accelerator within the European Organization for Nuclear Research (CERN). [...]
2025 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2490-2497
Fulltext: PDF; External link: Fulltext
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6.
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7.
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Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells
/ Marques, Cleiton M (IES, Montpellier) ; Wrobel, Frédéric (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Michez, Alain (IES, Montpellier) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Alía, Rubén García (CERN)
Electrical models play a crucial role in assessing the radiation sensitivity of devices. However, since they are usually not provided for end users, it is essential to have alternative modeling approaches to optimize circuit design before irradiation tests, and to support the understanding of post-irradiation data. [...]
2024 - 16 p.
- Published in : Electronics 13 (2024) 1954
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8.
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Latest FLUKA developments
/ Hugo, Gabrielle (CERN) ; Ahdida, Claudia (CERN) ; Bozzato, Davide (CERN) ; Calzolari, Daniele (CERN ; U. Padua (main)) ; Cerutti, Francesco (CERN) ; Ciccotelli, Alessia (CERN ; U. Manchester (main)) ; Cimmino, Anna (ELI-Beamlines, Dolni Brezany) ; Devienne, Arnaud (CERN) ; Servelle, Andre Donadon (CERN ; Ecole Polytechnique, Lausanne) ; Dyrcz, Patrycja K (CERN) et al.
The FLUKA Monte Carlo code has recently undergone significant enhancements, driven by needs from its user community. Key improvements are discussed, such as a new point-wise treatment for the interactions of low-energy neutrons, the incorporation of a new model for nuclear elastic scattering of protons below 250 MeV, explicit generation of synchrotron radiation photons during charged particle tracking, a revised modeling approach for coherent effects in bent crystals, and the addition of arc-DPA scoring. [...]
2024 - 9 p.
- Published in : EPJ Nuclear Sci. Technol. 10 (2024) 20
Fulltext: PDF;
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9.
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Results of Single Event Effect Testing at the New HEARTS@CERN High-Energy Heavy Ion Facility at CERN
/ Coronetti, Andrea (CERN ; Montpellier U.) ; Barbero, Mario Sacristan (CERN ; Montpellier U.) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Johnson, Eliott (CERN) ; Klimek, Karolina Maria (CERN) ; Waets, Andreas (CERN) ; Alia, Ruben Garcia (CERN)
We present results for SEU, SEL and SEB testing of several electronic devices under high-energy heavy ion irradiation at the new HEARTS@CERN facility at CERN..
2024 - 9 p.
- Published in : 10.1109/REDW61286.2024.10759246
In : 2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC), Ottawa, ON, Canada, 22 - 27 Jul 2024
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10.
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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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