Chapon, Arnaud - Resultados de la búsqueda

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Comparison of High Energy X-Ray and Cobalt-60 Irradiations on MOS Capacitors / Girones, Vincent (Montpellier U.) ; Boch, Jérôme (Montpellier U.) ; Saigné, Frédéric (Montpellier U.) ; Carapelle, Alain (CERN) ; Chapon, Arnaud ; Maraine, Tadec (Montpellier U.) ; Alía, Rubén García (CERN)
The use of a high energy X-ray generator for Total Ionizing Dose (TID) testing is studied on metal-oxide semiconductor (MOS) capacitors. Several conditions were studied for the high energy X-ray irradiations (with aluminum and lead filters) and the experimental results are compared to Cobalt 60 (Co-60) irradiations. [...]
2024 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
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In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1879-1886

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The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices / Girones, Vincent (CNRS, France ; Montpellier U.) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Carapelle, Alain ; Chapon, Arnaud ; Maraine, Tadec (CNRS, France ; Montpellier U.) ; Labau, Timothee (CNRS, France ; Montpellier U.) ; Saigné, Frédéric (CNRS, France ; Montpellier U.) ; García Alía, Rubén (CERN)
A high-energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. [...]
2023 - 8 p. - Published in : IEEE Trans. Nucl. Sci.

In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1982-1989

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11	Chapon, A

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