CERN Accelerating science

Αρχική Σελίδα > Αποτελέσματα αναζήτησης: Prakasa, E.
Παραδείγματα αναζήτησης
Σύνθετη Αναζήτηση
Add to Search +
Αναζήτηση συλλογές:
Ταξινόμηση με: Παρουσίαση αποτελεσμάτων: Μορφή αποτελεσμάτων:
CERN Document Server 6 εγγραφές βρέθηκαν  Η έρευνα πήρε 1.28 δευτερόλεπτα. 
1.
Measurement of Si pixel sensor alignment for the ALICE ITS detector / Satya Wicaksana, Ahmad (Jakarta LIPI, Indonesian Inst. Sci. ; Sultan Ageng Tirtayasa U.) ; Prakasa, Esa (Jakarta LIPI, Indonesian Inst. Sci.) ; Di Mauro, Antonio (CERN) ; Wardoyo, Siswo (Sultan Ageng Tirtayasa U.)
A Large Ion Collider Experiment (ALICE) experiment is one of the four experiments at the Large Hadron Collider (LHC) designed to investigate the status of matter under very high energy densities produced during heavy-ion collisions. The ALICE inner tracking system (ITS) consists of seven concentric cylindrical layers of monolithic silicon pixel sensors known as ALICE pixel detector (ALPIDE). [...]
2024 - 16 p. - Published in : Meas. Sci. Technol. 35 (2024) 095016 Fulltext: PDF;
Αναλυτική εγγραφή - Παρόμοιες εγγραφές
2.
ALICE upgrades during the LHC Long Shutdown 2 / ALICE Collaboration
A Large Ion Collider Experiment (ALICE) has been conceived and constructed as a heavy-ion experiment at the LHC. During LHC Runs 1 and 2, it has produced a wide range of physics results using all collision systems available at the LHC. [...]
arXiv:2302.01238; CERN-EP-2023-009.- Geneva : CERN, 2024-05-23 - 159 p. - Published in : JINST 19 (2024) P05062 Draft (restricted): PDF; Fulltext: 2302.01238 - PDF; document - PDF;
In : The Large Hadron Collider and The Experiments for Run 3
Αναλυτική εγγραφή - Παρόμοιες εγγραφές
3.
Detecting the position of the sealring and the edge on the sensor chip / Panjaitan, G R (Parahyangan Catholic U.) ; Lhaksmana, K M (Parahyangan Catholic U.) ; Prakasa, E (Bandung Inst. Tech.) ; Musa, L (CERN)
ALICE (A Large Ion Collider Experiment) is one of the physics projects developed by CERN. The project aims to observe the results of collisions between proton and proton, proton and nucleus, and nucleus with nucleus. [...]
2019 - 10 p. - Published in : J. Phys. : Conf. Ser. 1192 (2019) 012063 Fulltext: PDF;
In : 2nd International Conference on Data and Information Science (ICoDIS 2018), Bandung, Indonesia, 15 - 16 Nov 2018, pp.012063
Αναλυτική εγγραφή - Παρόμοιες εγγραφές
4.
First demonstration of in-beam performance of bent Monolithic Active Pixel Sensors / ALICE ITS project Collaboration
A novel approach for designing the next generation of vertex detectors foresees to employ wafer-scale sensors that can be bent to truly cylindrical geometries after thinning them to thicknesses of 20-40$\mu$m. To solidify this concept, the feasibility of operating bent MAPS was demonstrated using 1.5$\times$3cm ALPIDE chips. [...]
arXiv:2105.13000.- 2022-04-01 - 14 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1028 (2022) 166280 Fulltext: PDF;
Αναλυτική εγγραφή - Παρόμοιες εγγραφές
5.
A next-generation LHC heavy-ion experiment / Adamová, D. (Rez, Nucl. Phys. Inst.) ; Aglieri Rinella, G. (CERN) ; Agnello, M. (INFN, Turin ; Turin Polytechnic) ; Ahammed, Z. (IISER, Kolkata) ; Aleksandrov, D. (Kurchatov Inst., Moscow) ; Alici, A. (Enrico Fermi Ctr., Rome ; INFN, Bologna) ; Alkin, A. (BITP, Kiev) ; Alt, T. (Frankfurt U., Inst. Kernphys.) ; Altsybeev, I. (St. Petersburg State U.) ; Andreou, D. (CERN) et al.
The present document discusses plans for a compact, next-generation multi-purpose detector at the LHC as a follow-up to the present ALICE experiment. [...]
arXiv:1902.01211. - 2019 - 21.
Full text
Αναλυτική εγγραφή - Παρόμοιες εγγραφές
6.
Development of visual inspection system for detecting surface defects on sensor chip / Nurhadiyatna, A (U. Zagreb (main) ; Jakarta LIPI, Indonesian Inst. Sci.) ; Loncaric, S (U. Zagreb (main)) ; Prakasa, E (Jakarta LIPI, Indonesian Inst. Sci.) ; Kurniawan, E (Jakarta LIPI, Indonesian Inst. Sci.) ; Khoirudin, A A (U. Zagreb (main)) ; Musa, L (CERN) ; Reidler, P (CERN)
This paper presents a visual inspection method based on image processing techniques. The method aims to detect surface defects found on pixel chip pads. [...]
2018 - 6 p. - Published in : 10.1109/IC3INA.2017.8251748
In : 5th International Conference on Computer, Control, Informatics and its Applications, Jakarta, 23-26 Oct 2017, pp.100-105
Αναλυτική εγγραφή - Παρόμοιες εγγραφές

Δείτε ακόμη: παρόμοια ονόματα συγγραφέων
2 Prakasa, E
2 Prakasa, Esa
Ενδιαφέρεστε να ενημερώνεστε για νέα αποτελέσματα σχετικά με το ερώτημα αυτό;
Δημιουργήστε ένα προσωπικό email alert ή εγγραφείτε στο RSS feed.
Δεν βρήκατε αυτό που αναζητούσατε; Δοκιμάστε την έρευνά σας σε άλλους servers:
Prakasa, E. σε Amazon
Prakasa, E. σε CERN EDMS
Prakasa, E. σε CERN Intranet
Prakasa, E. σε CiteSeer
Prakasa, E. σε Google Books
Prakasa, E. σε Google Scholar
Prakasa, E. σε Google Web
Prakasa, E. σε IEC		Prakasa, E. σε IHS
Prakasa, E. σε INSPIRE
Prakasa, E. σε ISO
Prakasa, E. σε KISS Books/Journals
Prakasa, E. σε KISS Preprints
Prakasa, E. σε NEBIS
Prakasa, E. σε SLAC Library Catalog
Prakasa, E. σε Scirus