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Real-Time SER Measurements of CMOS Bulk 40- and 65-nm SRAMs Combined With Neutron Spectrometry at the JET Tokamak During Its Final D-T Plasma Operation
/ Dentan, Martin (CEA Cadarache ; CERN) ; Moindjie, Soilihi (CNRS, France) ; Cecchetto, Matteo (CERN) ; Autran, Jean-Luc (CNRS, France) ; Alia, Rubén Garcia (CERN) ; Naish, Richard (Culham Lab) ; Waterhouse, John (Culham Lab) ; Horton, Alan R (Culham Lab) ; Litaudon, Xavier (CEA Cadarache) ; Munteanu, Daniela (CNRS, France) et al.
We performed soft error rate (SER) characterization of 40- and 65-nm bulk CMOS static random access memories (SRAMs) combined with neutron spectrometry in the deuterium-tritium (D-T)-fueled Joint European Torus (JET) tokamak during its final D-T plasma operation (September and October 2023) producing a series of several dozens of power pulses. Our experimental results demonstrate the impact of machine operation on the electronics’ reliability, emulating realistic conditions for circuits exposed to the partially radiation-shielded environment of future fusion reactors. [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1486-1495
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2.
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Energy Deposition and Characterization of Single-Event Upset and Latch-Up Cross Sections With 14 MeV and Thermal Neutrons
/ Cecchetto, Matteo (CERN) ; Alía, Rubén García (CERN) ; Lerner, Giuseppe (CERN) ; Bilko, Kacper (CERN) ; Pujol, Francesc Salvat (CERN) ; Vlachoudis, Vasilis (CERN) ; Cerutti, Francesco (CERN)
Single-event latch-up (SEL) cross sections of static random access memory (SRAM) at high energy (100–200 MeV)
are generally not reproducible with 14-MeV neutrons, differently to single-event upset (SEU) cross sections. We explain
this phenomenon through Monte Carlo simulations, analyzing neutron–silicon interactions and the indirect energy deposition
in sensitive volumes (SVs) resembling the two mechanisms, showing that the former approach is not sufficient to explain
how the energy is deposited [...]
2025 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 72 (2025) 2847-2856
Fulltext: PDF; External link: Fulltext
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3.
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Quantification of Neutron-Induced Single-Event Upsets in a Static Random-Access Memory by Clinical High-Energy Photon Beam
/ Gabrisch, Lukas (Oldenburg U.) ; Cecchetto, Matteo (CERN) ; Delfs, Björn (Oldenburg U.) ; Looe, Hui Khee (Oldenburg U.) ; Budroweit, Jan (DLR, Bremen) ; Alía, Rubén García (CERN) ; Poppe, Björn (Oldenburg U.) ; Wyrwoll, Vanessa (Oldenburg U.)
The possibility of using calibrated static random-access memory (SRAM) memory for the quantification of neutron fluence in a radiotherapy facility for cancer treatment utilizing a high-energy 15-MV photon beam (Bremsstrahlung) from an electron linear accelerator has been exploited in this work. This has been performed by varying the field size of the photon beam and the positioning of the SRAM memory at three different positions in relation to the isocenter of the beam. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1503-1510
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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5.
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Preliminary study of electronics reliability in ITER neutron environment
/ Dentan, Martin (Euratom, St. Paul Lez Durance ; CEA Cadarache) ; Borgese, Gianluca (Euratom, St. Paul Lez Durance) ; Autran, Jean-Luc (Aix-Marseille U. ; Rennes U.) ; Munteanu, Daniela (IM2NP, Marseille) ; Moindjie, Soilihi (IM2NP, Marseille) ; Bucalossi, Jérôme (CEA Cadarache) ; Moreau, Philippe (CEA Cadarache) ; Pellissier, Francis-Pierre (CEA Cadarache) ; Santraine, Benjamin (CEA Cadarache) ; Roche, Philippe et al.
We validated a method for predicting the Soft Error Rate (SER) in the WEST tokamak operated with deuterium plasmas, and we applied it to predict the SER in the ITER tokamak operated with deuterium-tritium plasmas..
2022. - 5 p.
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6.
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Sacristan Barbero, Mario (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Aguiar, Ygor Q (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Danzeca, Salvatore (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Hands, Alex (TRIUMF) et al.
We present a calibration of a commercial silicon diode with proton and alpha beams and gamma rays. The diode together with a fast acquisition chain can be exploited for both direct and indirect (through the secondary radiation field) beam characterization. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 777-784
Fulltext: PDF;
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7.
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Ultra-Large Silicon Diode for Characterizing Low-Intensity Radiation Environments
/ Biłko, Kacper (CERN ; Jean Monnet U.) ; García Alía, Rubén (CERN) ; Girard, Sylvain (Jean Monnet U. ; IUF, Paris) ; Barbero, Mario Sacristan (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Brucoli, Matteo (CERN) ; Danzeca, Salvatore (CERN) ; Hands, Alex (CERN) ; Holgado, Pedro Martín (Seville U.) et al.
We present applications of a large commercial silicon diode (50 cm $^{2}\,\,\times 500\,\,{\mu }\text{m}$ ) for monitoring low-intensity radiation fields, together with benchmarks via Monte Carlo simulations. After energy calibration with monoenergetic proton and alpha beams in the 2–8-MeV range, we show that the detector is capable of measuring atmospheric radiation at the ground level, not only in terms of a total number of events but also through their energy deposition distribution. [...]
2024 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 770-776
Fulltext: PDF;
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8.
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Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility Network
/ García Alía, Rubén (CERN) ; Coronetti, Andrea ; Bilko, Kacper ; Cecchetto, Matteo ; Datzmann, Gerd ; Fiore, Salvatore ; Girard, Sylvain
RADNEXT is an EU-funded network of irradiation facilities and radiation effects’ experts aimed at increasing the quantity and quality of user access to accelerator infrastructure and improving the diversity and harmonization across facilities. Along with beam provision to worldwide radiation effects’ users, RADNEXT has an ambitious research program oriented at improving radiation effects’ testing, of which an example of a heavy ion facility intercomparison at very different energy regimes is included in this work. [...]
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1596-1605
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9.
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN
/ Lerner, Giuseppe (CERN) ; Pelissou, Pierre (CERN ; INSA, Toulouse) ; Aguiar, Ygor Q (CERN) ; Sacristan Barbero, Mario (CERN) ; Cecchetto, Matteo (CERN) ; Biłko, Kacper (CERN) ; Coussen, Louise (CERN ; INSA, Toulouse) ; Emriskova, Natalia (CERN) ; García Alía, Rubén (CERN) ; Dyks, Luke (CERN ; Oxford U.) et al.
The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced single-event effects (SEEs) in electronic devices. In this work, we study a setup where the 200-MeV electron beam of the CLEAR accelerator at European Organization for Nuclear Research [Centre Européen pour la Recherche Nucléaire (CERN)] is directed on an aluminum target to produce a radiation field with a large neutron component. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1572-1579
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10.
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Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN
/ Cecchetto, Matteo (CERN) ; Sacristan Barbero, Mario (CERN) ; Lerner, Giuseppe (CERN) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Senajova, Dominika (CERN) ; Garcia Infantes, Francisco (CERN) ; Pavon Rodriguez, Jose Antonio (CERN) ; Sabate Gilarte, Marta (CERN) ; Vlachoudis, Vasilis (CERN) et al.
We study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1587-1595
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