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An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs / Coronetti, Andrea (CERN ; Montpellier U.) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Kastriotou, Maria ; Cazzaniga, Carlo ; Frost, Christopher D ; Saigné, Frédéric (Montpellier U.)
The thermal neutron threat to the reliability of electronic devices caused by $^{10}\text{B}$ capture is a recognized issue that prompted changes in the manufacturing process of electronic devices with the aim of limiting as much as possible the presence of this isotope nearby device sensitive volumes (SVs). $^{14}\text{N}$ can also capture thermal neutrons and release low-energy protons (LEPs; through the $^{14}\text{N}$ (n, p) $^{14}\text{C}$ reaction) that have high enough linear energy transfer (LET) to cause single-event upsets (SEUs). [...]
2023 - 9 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1634-1642

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Thermal-to-high-energy neutron SEU characterization of commercial SRAMs / Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Garcia Alia, Ruben (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Cazzaniga, Carlo (Unlisted, UK) ; Kastriotou, Maria (Unlisted, UK) ; Cecchetto, Matteo (CERN) ; Bilko, Kacper (CNA, Seville) ; Martin-Holgado, Pedro
Several commercial SRAMs have been tested by the CERN R2E project with neutrons of various energy. The test data are used to cross-compare facilities and to analyze variabilities within SRAMs from the same manufacturer. [...]
2021 - 5 p. - Published in : 10.1109/nsrec45046.2021.9679344 Fulltext: PDF;
In : 2021 IEEE Radiation Effects Data Workshop (REDW 2021), Online, US, 17 - 23 Jul 2021

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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM / Luza, Lucas Matana (LIRMM, Montpellier) ; Soderstrom, Daniel (Jyvaskyla U.) ; Puchner, Helmut (Unlisted, US) ; Alia, Ruben Garcia (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Bosio, Alberto (Lyon, Ecole Centrale) ; Dilillo, Luigi (LIRMM, Montpellier)
In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and singlebit upsets..
2020 - 6 p. - Published in : 10.1109/dtis48698.2020.9080918
In : 15th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Marrakesh, Morocco, 1 - 3 Apr 2020, pp.1-6

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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below / Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Cecchetto, Matteo (CERN) ; Wang, Jialei (Leuven U.) ; Tali, Maris (CERN) ; Martinez, Pablo Fernandez (CERN) ; Kastriotou, Maria (CERN) ; Papadopoulou, Athina (CERN) ; Bilko, Kacper (CERN) ; Castellani, Florent (ENSAE, Toulouse) ; Sacristan, Mario (CERN) et al.
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions..
2020 - 8 p. - Published in : 10.1109/redw51883.2020.9325822
In : 2020 IEEE Radiation Effects Data Workshop, Online, US, 7 Dec 2020, pp.1-8

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