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Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process / Rinella, Gianluca Aglieri (CERN) ; Alocco, Giacomo (INFN, Cagliari) ; Antonelli, Matias (INFN, Trieste) ; Baccomi, Roberto (INFN, Trieste) ; Beole, Stefania Maria (INFN, Turin) ; Blidaru, Mihail Bogdan (Heidelberg U.) ; Buttwill, Bent Benedikt (Heidelberg U.) ; Buschmann, Eric (CERN) ; Camerini, Paolo (Trieste U. ; INFN, Trieste) ; Carnesecchi, Francesca (CERN) et al.
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. [...]
arXiv:2403.08952.- 2024-09-21 - 40 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 1069 (2024) 169896 Fulltext: 2403.08952 - PDF; Publication - PDF;

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Silicon microchannel frames for high-energy physics experiments / Poonsawat, W (Rajamangala U. Tech. Isan) ; Supadech, J (Thai Microelectronics Center) ; Klunngien, N (Thai Microelectronics Center) ; Jeamsaksiri, W (Thai Microelectronics Center) ; Ritjoho, N (Suranaree U. of Tech.) ; Laojamnongwong, N (Suranaree U. of Tech.) ; Mapelli, A (CERN) ; Francescon, A (CERN) ; Alvarez Feito, D (CERN) ; Kobdaj, C (Suranaree U. of Tech.)
The design of detectors used for experiments in high-energy physics requires a light, stiff, and efficient cooling system with a low material budget. The use of silicon microchannel cooling plates has gained considerable interest in the last decade [...]
2021 - 10 p. - Published in : JINST 16 (2021) P08050 Fulltext: PDF;

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Development of the SLRI beam test facility for characterization of monolithic active pixel sensors / Kittimanapun, K (Unlisted, TH) ; Chanlek, N (unlisted, TH) ; Klysubun, P (unlisted, TH) ; Kobdaj, C (Suranaree U. of Tech.) ; Lakrathok, A (Suranaree U. of Tech.) ; Laojamnongwong, N (Suranaree U. of Tech.) ; Mager, M (CERN) ; Musa, L (CERN)
Synchrotron Light Research Institute (SLRI) has successfully constructed a new experimental station, a Beam Test Facility (BTF), to the current SLRI accelerator complex. SLRI-BTF is capable of producing electron test beams with the number of electrons ranging from a few to millions of electrons per spill and with tunable energy from 40 MeV up to 1.2 GeV. [...]
2019 - 7 p. - Published in : Nucl. Instrum. Methods Phys. Res., A 930 (2019) 105-111

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1	Laojamnongwong, Natthawut

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