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How the Analysis of Archival Data Could Provide Helpful Information About TID Degradation. Case Study: Bipolar Transistors / Martín-Holgado, Pedro (Seville U.) ; Romero-Maestre, Amor (Seville U.) ; de-Martín-Hernández, José (Seville U.) ; González-Luján, José J (Unlisted, ES) ; Illera-Gómez, Iván (Seville U.) ; Jiménez-de-Luna, Yolanda (Seville U.) ; Morilla, Fernando (Madrid, Natl. U. Distance Educ.) ; Barbero, Mario Sacristan (CERN) ; Garcia Alia, Rubén (CERN) ; Domínguez, Manuel (Unlisted, ES) et al.
A critical step of radiation hardness assurance (RHA) for space systems is given by the parts selection in accordance with the observed (or estimated) radiation effects. Although radiation testing is the most decisive way of studying the radiation degradation of electronic components, the increasing use of commercial off-the-shelf (COTS) devices and the challenges posed by $NewSpace$ are pushing the need of finding new approaches to assess the risk associated with radiation environments. [...]
2022 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1691-1699

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