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Electron Beam Diagnostics Using Diffraction Radiation / Feng, Bibo ; Gabella, William E
Diffraction radiation, emitted from ralativistic electron bunches, has the potential applications of non-intercepting electron beam diagnostics. The electron longitudinal distribution in a bunch can be obtained from the coherent diffraction radiation spectrum; the beam transverse properties, such as beam size, divergence and emittance, can be measured through the analysis of the angular distribution of the diffraction radiation. [...]
2004 External link: Published version from JACoW
In : 26th International Free Electron Laser Conference and 11th FEL User Workshop 2004, Trieste, Italy, 29 Aug - 3 Sep 2004, pp.e-proc. TUPOS58

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1	Gabella, W
21	Gabella, W E
4	Gabella, W.E.
116	Gabella, William

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