| Article | |
| Title | X-Ray Microdiffraction as a Probe to Reveal Flux Divergences in Interconnects |
| Author(s) | Spolenak, R ; Tamura, N ; Patel, J R |
| Publication | 2006 |
| In: | AIP Conf. Proc. 817 (2006) pp.288-295 |
| In: | 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12 - 14 Sep 2005, pp.288-295 |
Zapis kreiran 2006-03-28, zadnja izmjena 2007-09-16
External link:
Published version from AIP
Published version from AIP