CERN Accelerating science

Article
Title	Single Shot Electron-Beam Bunch Length Measurements
Author(s)	Berden, G ; Knippels, G M H ; Oepts, D ; Van der Meer, A F G
Affiliation	(FOM, Institute for Plasma Physics 'Rijnhuizen', Nieuwegein, The Netherlands Abertay, University of Abertay Dundee, Dundee, UK CNU, Capital Normal University, Beijing, China RPI, Rensselaer Polytechnic Institute, Troy, NY, USA)
Publication	2003
In:	6th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators, Mainz, Germany, 5 - 7 May 2003, pp.20
Subject category	Accelerators and Storage Rings
Abstract	It is recognised by the Instrumentation community that 4th generation light sources (like TESLA, LCLS) are posing some of the most stringent requirements on beam diagnostics. Among these, the single-shot electro-optic measurement of the bunch length and shape in the sub-picosecond domain is an ongoing development. The electro-optic detection method makes use of the fact that the local electric field of a highly relativistic electron bunch moving in a straight line is almost entirely concentrated perpendicular to its direction of motion. This electric field makes an electro-optic crystal placed in the vicinity of the beam birefringent. The amount of birefringence depends on the electric field and is probed by monitoring the change of polarization of the wavelength components of a chirped, synchronized Ti:sapphire laser pulse. This talk will provide details of the experimental setup at the Free Electron Laser for Infrared eXperiments (FELIX) in Nieuwegein, The Netherlands, where single shot images have been obtained of 1.7 ps long electron bunches (beam energy 46 MeV, charge per bunch 200 pC). Furthermore, future upgrading possibilities will be discussed.