CERN Accelerating science

CMS Note
Report number CMS-NOTE-2000-024
Title First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
Author(s) Agosteo, S ; Castellani, Lorenzo ; D'Angelo, G ; Favalli, A ; Lippi, Ivano ; Martinelli, Roberto ; Zotto, Pierluigi
Submitted by 8 Mar 2000
Subject category Detectors and Experimental Techniques
Accelerator/Facility, Experiment CERN LHC ; CMS
Free keywords MUONS
Abstract Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. The results are used to guess the upper limits on the mean time between failures in the whole barrel muon detector.
Copyright/License Preprint: (License: CC-BY-4.0)

Corresponding record in: Inspire


 Record creato 2003-11-29, modificato l'ultima volta il 2018-06-14


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