Report number
| CMS-NOTE-2000-024 |
Title
| First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics |
Author(s)
| Agosteo, S ; Castellani, Lorenzo ; D'Angelo, G ; Favalli, A ; Lippi, Ivano ; Martinelli, Roberto ; Zotto, Pierluigi |
Submitted by
| 8 Mar 2000 |
Subject category
| Detectors and Experimental Techniques |
Accelerator/Facility, Experiment
| CERN LHC ; CMS |
Free keywords
| MUONS |
Abstract
| Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. The results are used to guess the upper limits on the mean time between failures in the whole barrel muon detector. |
Copyright/License
| Preprint: (License: CC-BY-4.0) |