| Article | |
| Title | Overview of the production and qualification tests of the lpGBT |
| Author(s) | Hernandez Montesinos, D (CERN) ; Baron, S (CERN) ; Biereigel, S (CERN) ; Hazell, P (CERN) ; Kulis, S (CERN) ; Vicente Leitao, P (CERN) ; Moreira, P (CERN) ; Porret, D (CERN) ; Wyllie, K (CERN) |
| Publication | 2024 |
| Number of pages | 8 |
| In: | JINST 19, 04 (2024) pp.C04048 |
| In: | Topical Workshop on Electronics for Particle Physics 2023 (TWEPP 2023), Geremeas, Sardinia, Italy, 1 - 6 Oct 2023, pp.C04048 |
| DOI | 10.1088/1748-0221/19/04/C04048 |
| Subject category | Detectors and Experimental Techniques |
| Abstract | The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC used in high-energy physics experiments for multipurpose high-speed bidirectional serial links. Around 200,000 chips have been tested with a production test system capable of exercising the majority of the ASIC functionality to ensure its correct operation.Furthermore, specific individual qualification tests were carried out beyond the production tester limits, including radiation, multi-drop bus topology, inter-chip communication through different types of electrical links and characterization of jitter and stability of the recovered clocks.In this article, an overview of the production and qualification tests is given together with their results demonstrating the robustness and flexibility of the lpGBT. |
| Copyright/License | © 2024-2025 The authors (License: CC-BY-4.0) |
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Record creato 2024-10-18, modificato l'ultima volta il 2024-10-18
