| Preprint | |
| Report number | CERN-EN-2020-001 |
| Title | Instrumentation and Procedures to Test Bent Silicon Crystals with X-Rays at CERN |
| Author(s) | Serrano Galvez, Pablo (CERN) ; Gavrikov, Yury (NRC Kurchatov Institute PNPI (RU)) |
| Publication | 2020 |
| Imprint | 04 Sep 2020 |
| Number of pages | 34 |
| Subject category | Engineering ; Science in General |
| Keywords | X-ray crystallography |
| Abstract | Recent studies of high-energy charged particles, channeling in bent crystals with SPS and LHC beams, have resulted in the essential progress of beam cleaning and beam extraction. Research led to the evolution of the High Luminosity LHC Project towards the development of a full-scale crystal collimation system optimized for ion beams operation in the LHC. The system should consist of several crystal collimation stations to be deployed in the LHC after Long Shutdown 2 (LS2). To provide a high collimation efficiency, the bent crystals mounted in the stations should meet a set of predefined requirements taken from detailed simulations of multi-turn beam-crystal interactions in the LHC. In this document, we report the measurement procedures developed and customized to validate bent crystals before the system’s installation in the LHC rings, using optical and X-ray equipment available at CERN. |
| Submitted by | [email protected] |
Registro creado el 2020-09-15, última modificación el 2020-09-16
