AFM-IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterization (Q31108644)
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English | AFM-IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterization |
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AFM-IR: combining atomic force microscopy and infrared spectroscopy for nanoscale chemical characterization (English)
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Alexandre Dazzi
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Craig B Prater
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Qichi Hu
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D Bruce Chase
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John F Rabolt
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Curtis Marcott
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1 December 2012
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66
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12
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1365-1384
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