Navigation überspringen
Universitätsbibliothek Heidelberg
Verfasst von:Jansson, Ulf
 Lewin, Erik
Titel:Sputter deposition of transition-metal carbide films — A critical review from a chemical perspective
Verlagsort:Amsterdam
Verlag:Elsevier B.V
 Elsevier
Jahr:2013
Fussnoten:ObjectType-Article-1 ; ObjectType-Feature-2 ; SourceType-Scholarly Journals-1 ; content type line 23
Inhalt:Thin films based on transition-metal carbides exhibit many interesting physical and chemical properties making them attractive for a variety of applications. The most widely used method to produce metal carbide films with specific properties at reduced deposition temperatures is sputter deposition. A large number of papers in this field have been published during the last decades, showing that large variations in structure and properties can be obtained. This review will summarise the literature on sputter-deposited carbide films based on chemical aspects of the various elements in the films. By considering the chemical affinities (primarily towards carbon) and structural preferences of different elements, it is possible to understand trends in structure of binary transition-metal carbides and the ternary materials based on these carbides. These trends in chemical affinity and structure will also directly affect the growth process during sputter deposition. A fundamental chemical perspective of the transition-metal carbides and their alloying elements is essential to obtain control of the material structure (from the atomic level), and thereby its properties and performance. This review covers a wide range of materials: binary transition-metal carbides and their nanocomposites with amorphous carbon; the effect of alloying carbide-based materials with a third element (mainly elements from groups 3 through 14); as well as the amorphous binary and ternary materials from these elements deposited under specific conditions or at certain compositional ranges. Furthermore, the review will also emphasise important aspects regarding materials characterisation which may affect the interpretation of data such as beam-induced crystallisation and sputter-damage during surface analysis.
ISSN:0040-6090
 1879-2731
Titel Quelle:Thin solid films
Jahr Quelle:2013
Band/Heft Quelle:536, S. 1-24
DOI:doi:10.1016/j.tsf.2013.02.019
URL:http://www.ub.uni-heidelberg.de/cgi-bin/edok?dok=https%3A%2F%2Ffanyv88.com%3A443%2Fhttps%2Fdx.doi.org%2F10.1016%2Fj.tsf.2013.02.019
 http://www.ub.uni-heidelberg.de/cgi-bin/edok?dok=https%3A%2F%2Ffanyv88.com%3A443%2Fhttps%2Fsearch.proquest.com%2Fdocview%2F1660080851
 http://www.ub.uni-heidelberg.de/cgi-bin/edok?dok=https%3A%2F%2Ffanyv88.com%3A443%2Fhttps%2Furn.kb.se%2Fresolve%3Furn%3Durn%3Anbn%3Ase%3Auu%3Adiva-20 ...
 DOI: https://doi.org/10.1016/j.tsf.2013.02.019
Sprache:English
Sach-SW:Affinity
 Amorphous films
 Amorphous materials
 Atomic structure
 Carbides
 Carbon
 Chemical stability
 Composition and phase identification
 Condensed matter: structure, mechanical and thermal properties
 Cross-disciplinary physics: materials science; rheology
 Crystal structure
 Crystallization
 Deposition
 Deposition by sputtering
 Exact sciences and technology
 Materials science
 Methods of deposition of films and coatings; film growth and epitaxy
 Nanocomposite
 Physics
 Sputtering
 Structure and morphology; thickness
 Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
 Theory and models of film growth
 Thin film structure and morphology
 Thin films
 Transition-metal carbide
Verknüpfungen:→ Sammelwerk


zum Seitenanfang