[en] Among many methods based on induction and analysis of characteristic X-ray scintillation process is the cheapest and the most simple one. It is suitable for the determination of coating thickness and composition of ores and alloys. Developing an up-to-date, universal, portable, high level instrument was decided in the Nuclear Research Institute of the Hungarian Academy of Sciences. The designed analyzer will contain, besides the usual units, a pair of differential filters and a sample changer. The accuracy will be 0,02-2%. (V.N.)