1.
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The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions
/ Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
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2.
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Fragmented High-Energy Heavy-Ion Beams for Electronics Testing
/ García Alía, Rubén (CERN) ; Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; Cerutti, Francesco (CERN) ; Coronetti, Andrea (CERN ; IES, Montpellier) ; Emriskova, Natalia (CERN) ; Esposito, Luigi (CERN) ; Pujol, Francesc Salvat (CERN) ; Waets, Andreas (CERN ; U. Zurich (main)) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Saigné, Frédéric (IES, Montpellier) et al.
Fragmented heavy-ion beams obtained from the
interaction of highly energetic ions with thick targets relative
to the ion ranges are proposed to mimic the high-penetration
linear energy transfer (LET) spectrum present in space and
for electronics testing. Our experimental data characterizing
fragmented heavy-ion beams show an excellent level of agreement
with the Monte Carlo simulations, serving as an initial proofof-concept of the proposed single-event effect (SEE) testing
approach..
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci. 70 (2023) 486-495
Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.486-495
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3.
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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4.
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Proton Direct Ionization Upsets at Tens of MeV
/ Coronetti, Andrea (CERN ; IES, Montpellier) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Wang, Jialei (Leuven U.) ; Saigné, Frédéric (IES, Montpellier) ; Javanainen, Arto (Jyvaskyla U. ; Vanderbilt U. (main)) ; Leroux, Paul (Leuven U.) ; Prinzie, Jeffrey (Leuven U.)
Experimental monoenergetic proton single-event upset (SEU) cross sections of a 65-nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies (< 3 MeV), but also at energies $>$ 3 MeV and extending up to tens of MeV. The SEU cross Section from 20-MeV protons exceeds the 200-MeV proton SEU cross Section by almost a factor of 3. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 70 (2023) 314-321
Fulltext: PDF;
In : 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.314-321
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5.
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Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility Network
/ García Alía, Rubén (CERN) ; Coronetti, Andrea ; Bilko, Kacper ; Cecchetto, Matteo ; Datzmann, Gerd ; Fiore, Salvatore ; Girard, Sylvain
RADNEXT is an EU-funded network of irradiation facilities and radiation effects’ experts aimed at increasing the quantity and quality of user access to accelerator infrastructure and improving the diversity and harmonization across facilities. Along with beam provision to worldwide radiation effects’ users, RADNEXT has an ambitious research program oriented at improving radiation effects’ testing, of which an example of a heavy ion facility intercomparison at very different energy regimes is included in this work. [...]
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1596-1605
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6.
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System Level Radiation Characterization of a 1U CubeSat Based on CERN Radiation Monitoring Technology
/ Secondo, R (CERN ; IES, Montpellier) ; García Alía, R (CERN) ; Peronnard, P (CERN) ; Brugger, M (CERN) ; Masi, A (CERN) ; Danzeca, S (CERN) ; Merlenghi, A (CERN) ; Chesta, E (CERN) ; Vaillè, J R (IES, Montpellier) ; Bernard, M (Montpellier U.) et al.
A CubeSat payload (PL) was designed at CERN and at the University Space Center of Montpellier, for the measurement of radiation and its effects on electronics and single event latchup recording on SRAM devices. The PL and the data handling modules were tested at the CERN mixed-field facility, in a Low Earth Orbit representative environment
2018 - 6 p.
- Published in : IEEE Trans. Nucl. Sci. 65 (2018) 1694-1699
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7.
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Assessment of the Quirónsalud Proton Therapy Centre Accelerator for Single Event Effects Testing
/ Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Alía, Rubén García (CERN) ; Sanchez, Juan Antonio Vera ; Mazal, Alejandro
High-energy proton testing is used for single-event effect (SEE) qualification of electronics employed in several radiation-harsh environments. Given the increasing demand, exploiting the capabilities of proton therapy centers for electronics testing may become desirable. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1571-1579
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8.
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Comparison Between In-flight SEL Measurement and Ground Estimation Using Different Facilities
/ Kerboub, N (CNES, Toulouse ; CERN ; [email protected]) ; Alia, R G (CERN) ; Mekki, J (CNES, Toulouse) ; Bezerra, F (CNES, Toulouse) ; Monteuuis, A (CERN) ; Fernández-Martinez, P (CERN) ; Danzeca, S (CERN) ; Brugger, M (CERN) ; Standarovski, D (CNES, Toulouse) ; Rauch, J (CNES, Toulouse)
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acquired by the CARMEN-3 experiment on-board the JASON-3 satellite (middle earth orbit, 1336 km, 66°) and an estimation using SEE rate calculation approaches from several facilities. A SRAM memory sensitive to single-event latchup (SEL) has been monitored in orbit, and the number of events per day was estimated using monoenergetic data coming from the Kernfysisch Versneller Instituut (protons) and Université Catholique de Louvain (heavy-ions) facilities as well as using mixed-field data coming from the Cern High energy AcceleRator Mixed field (CHARM) facility. [...]
2019 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1541-1547
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1541-1547
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9.
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An Analysis of the Significance of the 14N(n, p) 14C Reaction for Single-Event Upsets Induced by Thermal Neutrons in SRAMs
/ Coronetti, Andrea (CERN ; Montpellier U.) ; García Alía, Rubén (CERN) ; Lucsanyi, David (CERN) ; Letiche, Manon (Laue-Langevin Inst.) ; Kastriotou, Maria ; Cazzaniga, Carlo ; Frost, Christopher D ; Saigné, Frédéric (Montpellier U.)
The thermal neutron threat to the reliability of electronic devices caused by $^{10}\text{B}$ capture is a recognized issue that prompted changes in the manufacturing process of electronic devices with the aim of limiting as much as possible the presence of this isotope nearby device sensitive volumes (SVs). $^{14}\text{N}$ can also capture thermal neutrons and release low-energy protons (LEPs; through the $^{14}\text{N}$ (n, p) $^{14}\text{C}$ reaction) that have high enough linear energy transfer (LET) to cause single-event upsets (SEUs). [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1634-1642
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10.
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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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