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CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)
/ Bilko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Costantino, Alessandra (ESTEC, Noordwijk) ; Coronetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Delrieux, Marc (CERN) ; Emriskova, Natalia (CERN) ; Fraser, Matthew Alexander (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Johnson, Eliott Philippe (CERN) et al.
We present the progress related to CERN’s capacity of delivering highly penetrating, high-linear energy transfer (LET) heavy ions for radiation effect testing of electronic components within the CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations, and a 300- $\mu $ m-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1549-1556
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Temperature Effect on the Radioluminescence of Differently Doped Silica-Based Optical Fibers
/ Kerboub, Nourdine (CERN ; CNES, Toulouse ; Lab. Hubert Curien, St. Etienne) ; Di Francesca, Diego (CERN) ; Morana, Adriana (Lab. Hubert Curien, St. Etienne) ; Hamzaoui, Hicham El (PhLAM, Villeneuve d'Ascq) ; Ouerdane, Youcef (Lab. Hubert Curien, St. Etienne) ; Bouwmans, Géraud (PhLAM, Villeneuve d'Ascq) ; Habert, Rémi (PhLAM, Villeneuve d'Ascq) ; Cassez, Andy (PhLAM, Villeneuve d'Ascq) ; Boukenter, Aziz (Lab. Hubert Curien, St. Etienne) ; Capoen, Bruno (PhLAM, Villeneuve d'Ascq) et al.
We evaluate the temperature effect on the X-ray radiation-induced luminescence (RIL) of differently doped silica fibers obtained via the sol-gel route. Previous investigations showed that these optical materials exhibit interesting dosimetry properties, such as very good detection capabilities and linear response over a large range of dose rate. [...]
2024 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 2280-2286
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Fab-to-fab and run-to-run variability in 130 nm and 65 nm CMOS technologies exposed to ultra-high TID
/ Termo, G (CERN ; Ecole Polytechnique, Lausanne) ; Borghello, G (CERN) ; Faccio, F (CERN) ; Michelis, S (CERN) ; Koukab, A (Ecole Polytechnique, Lausanne) ; Sallese, J M (Ecole Polytechnique, Lausanne)
The discovery of a large fab-to-fab variability in the TID response of the CMOS technologies used in the design of ASICs for the particle detectors of the HL-LHC triggered a monitoring effort to verify the consistency of the CMOS production process over time. As of 2014, 22 chips from 3 different fabs in 130 nm CMOS technology and 11 chips from 2 different fabs in 65 nm CMOS technology have been irradiated to ultra-high doses, ranging from 100 Mrad(SiO$_{2}$) to 1 Grad(SiO$_{2}$). [...]
2023 - 9 p.
- Published in : JINST
In : Topical Workshop on Electronics for Particle Physics 2022 (TWEPP 2022), Bergen, Norway, 19 - 23 Sep 2022, pp.C01061
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Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
/ Waets, Andreas (CERN ; Zurich U.) ; Bilko, Kacper (CERN) ; Coronetti, Andrea (CERN) ; Emriskova, Natalia (CERN) ; Sacristan Barbero, Mario (CERN) ; García Alía, Rubén (CERN) ; Durante, Marco (Darmstadt, GSI) ; Schuy, Christoph (Darmstadt, GSI) ; Wagner, Tim (Darmstadt, GSI) ; Esposito, Luigi Salvatore (CERN) et al.
Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to provide VHE ions for radiation effects testing. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 1837-1845
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1837-1845
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Solar Particle Event Detection With the LUMINA Optical Fiber Dosimeter Aboard the International Space Station
/ Roche, Martin (CNES, Toulouse ; Lab. Hubert Curien, St. Etienne) ; Balcon, Nicolas (CNES, Toulouse) ; Clément, Florence (CNES, Toulouse) ; Cheiney, Pierrick ; Morana, Adriana (Lab. Hubert Curien, St. Etienne) ; Francesca, Diego Di (CERN) ; Jean-Christophe, Malapert (CNES, Toulouse) ; Kerboub, Nourdine (CNES, Toulouse) ; Marot, Lourdes Oro ; Ricci, Daniel (CERN) et al.
LUMINA, a fiber-based dosimeter, exploiting the radiation induced attenuation (RIA) phenomenon, has been operational inside the International Space Station (ISS) since August 2021. We discuss in this article its capability to detect the possible signatures of recent solar particle events (SPEs) through the related increase of the dose rate (DR) radiation level within the ISS. [...]
2024 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1580-1588
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The CELESTA CubeSat In-Flight Radiation Measurements and Their Comparison With Ground Facilities Predictions
/ Coronetti, Andrea (CERN) ; Zimmaro, Alessandro (CERN) ; Alía, Rubén García (CERN) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN) ; Slipukhin, Ivan (CERN) ; Amodio, Alessio (CERN) ; Dijks, Jasper (CERN) ; Peronnard, Paul (CERN) ; Secondo, Raffaello (CERN) et al.
The CELESTA CubeSat has employed radiation monitors developed by the Conseil Européen pour la Recherche Nucléaire (CERN) Centre, used for measuring the radiation environment at accelerators, to measure the space radiation field in a medium-Earth orbit (MEO). The technology is based on three static random-access memories (SRAMs) that are sensitive to single-event upsets (SEUs) and single-event latchups (SELs). [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1623-1630
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Characterization of Radiophotoluminescence Dosimeters Under X-Ray Irradiation at High Doses
/ Ferrari, M (Lab. Hubert Curien, St. Etienne) ; Aguiar, Y Q (CERN) ; Hasan, A (Lab. Hubert Curien, St. Etienne) ; Alem, A K (Lab. Hubert Curien, St. Etienne) ; Alía, R García (CERN) ; Donzella, A (Brescia U.) ; Pagano, D (Brescia U.) ; Sostero, L (Brescia U.) ; Zenoni, A (Brescia U.) ; Girard, S (Lab. Hubert Curien, St. Etienne ; IUF, Paris)
A characterization of radiophotoluminescence (RPL) dosimeters at high doses of X-ray radiation for applications in high-radiation areas is presented. Commercial FD-7 silver-doped phosphate glasses (1.5$\times$ 8.5mm) in use at CERN for passive dosimetry are irradiated using commercial X-ray tubes. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1821-1828
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Comparison of High Energy X-Ray and Cobalt-60 Irradiations on MOS Capacitors
/ Girones, Vincent (Montpellier U.) ; Boch, Jérôme (Montpellier U.) ; Saigné, Frédéric (Montpellier U.) ; Carapelle, Alain (CERN) ; Chapon, Arnaud ; Maraine, Tadec (Montpellier U.) ; Alía, Rubén García (CERN)
The use of a high energy X-ray generator for Total Ionizing Dose (TID) testing is studied on metal-oxide semiconductor (MOS) capacitors. Several conditions were studied for the high energy X-ray irradiations (with aluminum and lead filters) and the experimental results are compared to Cobalt 60 (Co-60) irradiations. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1879-1886
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