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The Silicon Microstrip Sensors of the ATLAS SemiConductor Tracker / Ahmad, A (Freiburg U. ; Taiwan, Inst. Phys.) ; Albrechtskirchinger, Z (Munich, Max Planck Inst.) ; Allport, P P (Liverpool U.) ; Alonso, J (LBL, Berkeley) ; Andricek, L (Munich, Max Planck Inst.) ; Apsimon, R J (Rutherford) ; Barr, A J (Cambridge U. ; University Coll. London) ; Bates, R L (Glasgow U.) ; Beck, G A (Queen Mary, U. of London) ; Bell, P J (CERN ; Manchester U.) et al.
This paper describes the AC-coupled, single-sided, p-in-n silicon microstrip sensors used in the SemiConductor Tracker (SCT) of the ATLAS experiment at the CERN Large Hadron Collider (LHC). [...]
ATL-INDET-PUB-2007-007 ; ATL-COM-INDET-2007-008 ; CERN-ATL-COM-INDET-2007-008. - 2007. - 23 p.
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Evolution of silicon microstrip detector currents during proton irradiation at the CERN PS / Harper, R S ; Buttar, C M ; Allport, P P ; Andricek, L ; Carter, J R ; Casse, G L ; Dawson, I ; Ferrère, D ; Grigson, C ; Morgan, D et al.
Prototype ATLAS silicon microstrip detectors have been irradiated to the dose predicted for 10 years of LHC operation with 24 GeV protons at the CERN PS whilst cooled to the ATLAS design operating temperature. The detector currents were monitored during irradiation, which allows the predictions of bulk radiation damage parameterizations to be tested. [...]
2002 - Published in : Nucl. Instrum. Methods Phys. Res., A 479 (2002) 548-54

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Recent results from the ATLAS SCT irradiation programme / Buttar, C M ; Allport, P P ; Carter, J R ; Casse, G L ; Costa, M ; Dawson, I ; Drage, L M ; Greenall, A ; Grigson, C ; Harper, R S et al.
The irradiation facility at the CERN proton synchrotron, set up to irradiate full-size prototypes of silicon microstrip detectors for the ATLAS semiconductor tracker, is described and measurements of the detector currents during irradiation are reported. The detector dark currents can be described by bulk radiation damage models demonstrating the radiation hardness of the detector design and allowing the current damage factor alpha and the acceptor introduction term p to be determined. [...]
2000 - Published in : Nucl. Instrum. Methods Phys. Res., A 447 (2000) 126-32

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