CERN Accelerating science

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1.
X-Ray Microdiffraction as a Probe to Reveal Flux Divergences in Interconnects / Spolenak, R ; Tamura, N ; Patel, J R
2006 - Published in : AIP Conf. Proc.: 817 (2006) , pp. 288-295 External link: Published version from AIP
In : 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany, 12 - 14 Sep 2005, pp.288-295
2.
Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films / Tamura, N ; MacDowell, A A ; Spolenak, R ; Valek, B C ; Brown, W L ; Celestre, R S ; Padmore, H A ; Batterman, B W ; Patel, J R
SLAC-REPRINT-2003-014.- Stanford, CA : SLAC, 2003 - Published in : J. Synchrotron Radiat.: 10 (2003) , pp. 137-143
3.
Electromigration induced plastic deformation in passivated metal lines / Valek, B C ; Bravman, J C ; Tamura, N ; MacDowell, A A ; Celestre, R S ; Padmore, H A ; Spolenak, R ; Brown, W L ; Batterman, B W ; Patel, J R
SLAC-PUB-9259.
- 2002. - 13 p.
Fulltext from SLAC
4.
High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron X-ray diffraction / Tamura, N ; MacDowell, A A ; Celestre, R S ; Padmore, H A ; Valek, B C ; Bravman, J C ; Spolenak, R ; Brown, W L ; Marieb, T ; Fujimoto, H et al.
SLAC-PUB-9260.
- 2002. - 17 p.
Fulltext from SLAC

似た著者名:
2 Spolenak, Ralph
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