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Metal-insulator transition in crystalline V$_2$O$_3$ thin films probed at atomic-scale using emission Mössbauer spectroscopy / Qi, B (Iceland U.) ; Gunnlaugsson, H P (Iceland U.) ; Ólafsson, S (Iceland U.) ; Gislason, H P (Iceland U.) ; Thorsteinsson, E B (Iceland U.) ; Arnalds, U B (Iceland U.) ; Mantovan, R (CNR-IMM, Catania) ; Unzueta l, I (Basque U., Bilbao) ; Zyabkin, D V (Ilmenau Tech. U.) ; Bharuth Ram, K (KwaZulu Natal U. ; DUT, Durban) et al.
Microscopic understanding the metal-to-insulator transition (MIT) in strongly correlated materials is critical to the design and control of modern “beyond silicon” Mott nanodevices. In this work, the local MIT behaviors in single crystalline V$_2$O$_3$ thin films were probed on an atomic scale by online $^{57}$Fe emission Mössbauer spectroscopy (eMS) following dilute ($<10^{-3}$ at.%) implantation of $^{57}$Mn$^+$ (T$_{1/2}$ = 90 s). [...]
2020 - Published in : Thin Solid Films 714 (2020) 138389

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1	Arnalds, Unnar B

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