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Radiochromic Film Dosimetry for VHEE and UHDR: Considerations for the CLEAR Facility and Comparisons with Alanine, RPL and Dosimetry Phantoms
/ Rieker, V.F. (CERN ; Oslo U.) ; Bateman, J.J. (Oxford U.) ; Wroe, L.M. (CERN) ; Caloz, M. (Unlisted, CH) ; Grilj, V. (Unlisted, CH) ; Aguiar, Y.Q. (CERN) ; Schüller, A. (Braunschweig, Phys. Tech. Bund.) ; Bailat, C. (Unlisted, CH) ; Farabolini, W. (CERN) ; Gilardi, A. (CERN) et al.
Radiochromic films (RCFs) offer valuable two-dimensional dosimetry capabilities with a conceptually simple operating principle that requires minimal investment, making them particularly suitable for very high energy electron (VHEE) FLASH dosimetry where dosimetry standards are currently lacking. [...]
arXiv:2506.16837.
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Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells
/ Marques, Cleiton M (IES, Montpellier) ; Wrobel, Frédéric (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Michez, Alain (IES, Montpellier) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Alía, Rubén García (CERN)
Electrical models play a crucial role in assessing the radiation sensitivity of devices. However, since they are usually not provided for end users, it is essential to have alternative modeling approaches to optimize circuit design before irradiation tests, and to support the understanding of post-irradiation data. [...]
2024 - 16 p.
- Published in : Electronics 13 (2024) 1954
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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
/ Slipukhin, Ivan (CERN) ; Coronetti, Andrea (CERN) ; Alía, Rubén García (CERN) ; Saigné, Frédéric (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier) ; Aguiar, Ygor Q (CERN) ; Cazzaniga, Carlo ; Kastriotou, Maria ; Dodd, Torran
System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
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In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1948-1955
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Characterization of Radiophotoluminescence Dosimeters Under X-Ray Irradiation at High Doses
/ Ferrari, M (Lab. Hubert Curien, St. Etienne) ; Aguiar, Y Q (CERN) ; Hasan, A (Lab. Hubert Curien, St. Etienne) ; Alem, A K (Lab. Hubert Curien, St. Etienne) ; Alía, R García (CERN) ; Donzella, A (Brescia U.) ; Pagano, D (Brescia U.) ; Sostero, L (Brescia U.) ; Zenoni, A (Brescia U.) ; Girard, S (Lab. Hubert Curien, St. Etienne ; IUF, Paris)
A characterization of radiophotoluminescence (RPL) dosimeters at high doses of X-ray radiation for applications in high-radiation areas is presented. Commercial FD-7 silver-doped phosphate glasses (1.5$\times$ 8.5mm) in use at CERN for passive dosimetry are irradiated using commercial X-ray tubes. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1821-1828
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
/ Barbero, Mario Sacristán (CERN ; IES, Montpellier) ; Slipukhin, Ivan (CERN ; IES, Montpellier) ; Cecchetto, Matteo (CERN) ; Prelipcean, Daniel (CERN) ; Aguiar, Ygor (CERN) ; Bilko, Kacper (CERN) ; Emriskova, Natalia (CERN) ; Waets, Andreas (CERN) ; Coronetti, Andrea (CERN) ; Kastriotou, Maria (Rutherford Appleton Laboratory) et al.
Ultrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
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In : Conference on Radiation and its Effects on Components and Systems (RADECS 2023), Toulouse, France, 25 - 29 Sep 2023, pp.1557-1564
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Online and offline Radiation-Induced Attenuation measurements on FD-7 radiophotoluminescence dosimeters irradiated at high X-ray doses
/ Hasan, A (Lab. Hubert Curien, St. Etienne) ; Aguiar, Y (Lab. Hubert Curien, St. Etienne ; CERN) ; García Alía, R (CERN) ; Campanella, C (Lab. Hubert Curien, St. Etienne) ; Morana, A (Lab. Hubert Curien, St. Etienne) ; Alem, A K (Lab. Hubert Curien, St. Etienne) ; Girard, S (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Mandal, A Raj (Lab. Hubert Curien, St. Etienne) ; Ferrari, M (Lab. Hubert Curien, St. Etienne)
Radiophotoluminescence (RPL) FD-7 glass dosimeters find applications in low to high dose radiation environments. This work presents an experimental characterization of RPL glass dosimeter, irradiated with 100 kV X-ray tubes at room temperature at doses ranging from 1.3 kGy to 0.47 MGy, much higher of their common use range. [...]
2024 - 9 p.
- Published in : Radiat. Meas. 177 (2024) 107246
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Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA Implications
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Danzeca, Salvatore (CERN) ; Di Francesca, Diego (CERN) ; Gilardoni, Simone (CERN) ; Girard, Sylvain (ICJ, Lyon ; IUF, Paris) ; Ricci, Daniel (CERN) ; Sebban, Marc (Lab. Hubert Curien, St. Etienne) ; Uznanski, Slawosz (CERN)
In this work, we present the radiation environment of the large hadron collider (LHC), focusing on the year 2022, the first after the Long Shutdown 2 (LS2) (2019–2021). We highlight the most prominent radiation-level changes with respect to the 2018 operation, commenting on the related Radiation Hardness Assurance implications. [...]
2024 - 11 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 607-617
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Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Sacristan Barbero, Mario (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne ; IUF, Paris) ; Aguiar, Ygor Q (CERN) ; Cecchetto, Matteo (CERN) ; Belanger-Champagne, Camille (TRIUMF) ; Danzeca, Salvatore (CERN) ; Hajdas, Wojtek (PSI, Villigen) ; Hands, Alex (TRIUMF) et al.
We present a calibration of a commercial silicon diode with proton and alpha beams and gamma rays. The diode together with a fast acquisition chain can be exploited for both direct and indirect (through the secondary radiation field) beam characterization. [...]
2024 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 71 (2024) 777-784
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