000740259 001__ 740259
000740259 003__ SzGeCERN
000740259 005__ 20201218140127.0
000740259 0248_ $$aoai:cds.cern.ch:740259$$pcerncds:CONF$$pcerncds:TALK
000740259 041__ $$aeng
000740259 111__ $$920030623$$aConference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III$$cMunich, Germany$$d23 - 26 Jun 2003$$f2003$$gmunich20030623b$$wDE$$z20030626
000740259 260__ $$c2003
000740259 490__ $$aProceedings of SPIE$$v5144
000740259 65017 $$2SzGeCERN$$aOther Fields of Physics
000740259 65027 $$2SzGeCERN$$aConference
000740259 690C_ $$aCONFERENCE
000740259 690C_ $$aANNOUNCEMENT
000740259 711__ $$aOptical Metrology 2003
000740259 916__ $$a3$$sh$$w200424
000740259 960__ $$a41
000740259 961__ $$c20080828$$h1109$$lCER01$$x20040608
000740259 963__ $$aPUBLIC
000740259 970__ $$a002451899CER
000740259 980__ $$aANNOUNCEMENT