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Abstract
| In the context of the development of radiation hard silicon microstrip detectors for the CMS Tracker, we have investigated the dependence of interstrip and backplane capacitance as well as depletion and breakdown voltage on the design parameters and substrate characteristics of the devices. Measurements have been made for strip pitches between 60 and 240 mu m and various strip implants and metal widths, using multi-geometry devices, fabricated on wafers of either <111> or <100> crystal orientation, of resistivities between 1 and 6 k Omega cm and of thicknesses between 300 and 410 mu m. The effect of irradiation on properties of devices has been studied with 24 GeV/c protons up to a fluence of 4.3*10/sup 14/ cm /sup -2/. (15 refs). |