002915019 001__ 2915019
002915019 003__ SzGeCERN
002915019 005__ 20241025203525.0
002915019 0247_ $$2DOI$$9IEEE$$a10.1109/TNS.2024.3424201
002915019 0248_ $$aoai:cds.cern.ch:2915019$$pcerncds:FULLTEXT$$pcerncds:CERN:FULLTEXT$$pcerncds:CERN
002915019 035__ $$9https://inspirehep.net/api/oai2d$$aoai:inspirehep.net:2820612$$d2024-10-24T07:39:27Z$$h2024-10-25T11:06:29Z$$mmarcxml
002915019 035__ $$9Inspire$$a2820612
002915019 041__ $$aeng
002915019 100__ $$aSlipukhin, Ivan$$jORCID:0000-0003-3949-5824$$uCERN$$vInstitute d’Électronique et des Systémes, Université de Montpellier, Montpellier, France
002915019 245__ $$9IEEE$$aEnhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring
002915019 260__ $$c2024
002915019 300__ $$a8 p
002915019 520__ $$9IEEE$$aSystem-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. The information received during the irradiation of a system might be therefore not sufficient for the identification of every system under test (SUT) malfunction. As a consequence, no action might be taken to recover the system operation while certain parts of its functionality would be lost due to the radiation-induced effects. This can lead to the incorrect execution of the system-level test and improper conclusions about radiation-induced effects. The present paper demonstrates a method allowing an efficient identification of system-level failures based on the system total current consumption monitoring. The proposed technique can be easily implemented with common instrumentation and at the same time provides valuable feedback on SUT operation. The retrieved current consumption information can be used to identify system failures that may be not observable through the communication channels that are by default included in the tested setup. Furthermore, the posttest analysis can be performed on the collected data to investigate the SUT condition along the complete timeline of its irradiation. The verification of the proposed method was performed during the qualification test of a system designed for applications at the high-energy particle accelerator facility.
002915019 540__ $$aCC BY-NC-ND 4.0$$uhttps://creativecommons.org/licenses/by-nc-nd/4.0/
002915019 542__ $$dThe authors$$g2024
002915019 65017 $$2SzGeCERN$$aDetectors and Experimental Techniques
002915019 6531_ $$9author$$aRadiation effects
002915019 6531_ $$9author$$aTesting
002915019 6531_ $$9author$$aMonitoring
002915019 6531_ $$9author$$aObservability
002915019 6531_ $$9author$$aParticle beams
002915019 6531_ $$9author$$aNeutrons
002915019 6531_ $$9author$$aInstruments
002915019 6531_ $$9author$$aTotal Consumption
002915019 6531_ $$9author$$aCurrent Consumption
002915019 6531_ $$9author$$aSystem-level Testing
002915019 6531_ $$9author$$aTotal Current Consumption
002915019 6531_ $$9author$$aInstrumentation
002915019 6531_ $$9author$$aElectronic System
002915019 6531_ $$9author$$aSystem Failure
002915019 6531_ $$9author$$aComplete System
002915019 6531_ $$9author$$aRadiation-induced Effects
002915019 6531_ $$9author$$aIdentification Of Failure
002915019 6531_ $$9author$$aPost-test Analysis
002915019 6531_ $$9author$$aLoss Function
002915019 6531_ $$9author$$aPart Of System
002915019 6531_ $$9author$$aTest System
002915019 6531_ $$9author$$aOperation Mode
002915019 6531_ $$9author$$aAbrupt Changes
002915019 6531_ $$9author$$aTest Setup
002915019 6531_ $$9author$$aSet Of Observations
002915019 6531_ $$9author$$aData Retrieval
002915019 6531_ $$9author$$aStatic Random Access Memory
002915019 6531_ $$9author$$aDifferent Modes Of Operation
002915019 6531_ $$9author$$aMean Time To Failure
002915019 6531_ $$9author$$aRadiation Field
002915019 6531_ $$9author$$aCurrent Decreases
002915019 6531_ $$9author$$aAdditional Source Of Information
002915019 6531_ $$9author$$aDose Concentration
002915019 6531_ $$9author$$aNeutron Flux
002915019 6531_ $$9author$$aRadiation Tolerance
002915019 6531_ $$9author$$aCalculation Of Cross Sections
002915019 6531_ $$9author$$aCERN high-energy accelerator mixed-field (CHARM) facility
002915019 6531_ $$9author$$aChipIr
002915019 6531_ $$9author$$aradiation hardness assurance (RHA)
002915019 6531_ $$9author$$asinge-event effect (SEE)
002915019 6531_ $$9author$$asystem observability
002915019 6531_ $$9author$$asystem-level test
002915019 690C_ $$aARTICLE
002915019 690C_ $$aCERN
002915019 700__ $$aCoronetti, Andrea$$jORCID:0000-0001-8840-7400$$uCERN$$vInstitute d’Électronique et des Systémes, Université de Montpellier, Montpellier, France
002915019 700__ $$aAlía, Rubén García$$jORCID:0000-0001-8030-1804$$uCERN
002915019 700__ $$aSaigné, Frédéric$$uIES, Montpellier
002915019 700__ $$aBoch, Jérôme$$jORCID:0000-0002-5660-7501$$uIES, Montpellier
002915019 700__ $$aDilillo, Luigi$$jORCID:0000-0002-1295-2688$$uIES, Montpellier
002915019 700__ $$aAguiar, Ygor Q$$jORCID:0000-0003-4416-2610$$uCERN
002915019 700__ $$aCazzaniga, Carlo$$jORCID:0000-0002-3110-0253
002915019 700__ $$aKastriotou, Maria$$jORCID:0000-0003-1010-2396
002915019 700__ $$aDodd, Torran
002915019 773__ $$c1948-1955$$n8$$pIEEE Trans. Nucl. Sci.$$v71$$y2024
002915019 773__ $$wC23-09-25.6
002915019 8564_ $$82627299$$s1737797$$uhttps://cds.cern.ch/record/2915019/files/Enhancement_of_System_Observability_During_System-Level_Radiation_Testing_Through_Total_Current_Consumption_Monitoring.pdf$$yFulltext
002915019 960__ $$a13
002915019 962__ $$b2806405$$k1948-1955$$ntoulouse202320925
002915019 980__ $$aARTICLE
002915019 980__ $$aConferencePaper