002875160 001__ 2875160
002875160 003__ SzGeCERN
002875160 005__ 20231018111543.0
002875160 0247_ $$2DOI$$9IEEE$$a10.1109/TNS.2023.3242460
002875160 0248_ $$aoai:cds.cern.ch:2875160$$pcerncds:FULLTEXT$$pcerncds:CERN:FULLTEXT$$pcerncds:CERN
002875160 035__ $$9https://inspirehep.net/api/oai2d$$aoai:inspirehep.net:2700559$$d2023-10-09T11:32:44Z$$h2023-10-10T04:47:35Z$$mmarcxml
002875160 035__ $$9Inspire$$a2700559
002875160 041__ $$aeng
002875160 100__ $$aCecchetto, Matteo$$jORCID:0000-0002-0557-4586$$uCERN
002875160 245__ $$9IEEE$$aElectronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN
002875160 260__ $$c2023
002875160 300__ $$a9 p
002875160 520__ $$9IEEE$$aWe study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. The SRAM detectors, based on single-event upset (SEU) and single-event latch-up (SEL) counts, each one with a different energy response, and RPL dosimeters were tested in a reference position, and the results were benchmarked to FLUKA simulations. Finally, the neutron spectra at NEAR are compared to those of the most well-known spallation sources and typical environments of interest, for accelerator and atmospheric applications, showing the potential of the facility for electronics irradiation.
002875160 540__ $$3publication$$aCC-BY-4.0$$fCERN-RP: IEEE$$uhttps://creativecommons.org/licenses/by/4.0/
002875160 65017 $$2SzGeCERN$$aDetectors and Experimental Techniques
002875160 6531_ $$9author$$aNeutrons
002875160 6531_ $$9author$$aAtmospheric measurements
002875160 6531_ $$9author$$aRadiation effects
002875160 6531_ $$9author$$aAtmospheric modeling
002875160 6531_ $$9author$$aRandom access memory
002875160 6531_ $$9author$$aMonte Carlo methods
002875160 6531_ $$9author$$aDetectors
002875160 6531_ $$9author$$adosimeters
002875160 6531_ $$9author$$adosimetry
002875160 6531_ $$9author$$aneutron spectra
002875160 6531_ $$9author$$aphotoluminescence
002875160 6531_ $$9author$$aradiation hardening (electronics)
002875160 6531_ $$9author$$aSRAM chips
002875160 6531_ $$9author$$aCERN high-energy accelerator mixed-field facility
002875160 6531_ $$9author$$adifferent energy response
002875160 6531_ $$9author$$aelectronics irradiation
002875160 6531_ $$9author$$aelectronics testing
002875160 6531_ $$9author$$aFLUKA simulations
002875160 6531_ $$9author$$aMonte Carlo simulations
002875160 6531_ $$9author$$an_TOF spallation source
002875160 6531_ $$9author$$aNEAR station
002875160 6531_ $$9author$$aneutron field
002875160 6531_ $$9author$$aneutron time-of-flight facility
002875160 6531_ $$9author$$aparticle fluxes
002875160 6531_ $$9author$$aradio-photoluminescence dosimeters
002875160 6531_ $$9author$$aRPL dosimeters
002875160 6531_ $$9author$$asimilitudes
002875160 6531_ $$9author$$asingle-event latch
002875160 6531_ $$9author$$aSRAM detectors
002875160 6531_ $$9author$$atest positions
002875160 6531_ $$9author$$atypical quantities
002875160 6531_ $$9author$$awell-characterized static random access memories
002875160 6531_ $$9author$$awell-known spallation sources
002875160 6531_ $$9author$$aCERN high-energy accelerator mixed-field facility (CHARM)
002875160 6531_ $$9author$$aFLUKA Monte Carlo simulations
002875160 6531_ $$9author$$aNEAR
002875160 6531_ $$9author$$aneutron time-of-flight (n_TOF)
002875160 6531_ $$9author$$aneutrons
002875160 6531_ $$9author$$aradio-photoluminescence (RPL)
002875160 6531_ $$9author$$asingle-event effects (SEEs)
002875160 6531_ $$9author$$aspallation facilities
002875160 6531_ $$9author$$astatic random access memory (SRAM)
002875160 690C_ $$aARTICLE
002875160 690C_ $$aCERN
002875160 693__ $$aCERN PS$$enTOF
002875160 700__ $$aSacristan Barbero, Mario$$jORCID:0000-0002-8903-1449$$uCERN
002875160 700__ $$aLerner, Giuseppe$$jORCID:0000-0002-0976-4993$$uCERN
002875160 700__ $$aGarcía Alía, Rubén$$jORCID:0000-0001-8030-1804$$uCERN
002875160 700__ $$aAguiar, Ygor$$jORCID:0000-0003-4416-2610$$uCERN
002875160 700__ $$aSenajova, Dominika$$jORCID:0000-0002-2846-7740$$uCERN
002875160 700__ $$aGarcia Infantes, Francisco$$uCERN
002875160 700__ $$aPavon Rodriguez, Jose Antonio$$jORCID:0000-0001-9501-2570$$uCERN
002875160 700__ $$aSabate Gilarte, Marta$$jORCID:0000-0003-1026-3210$$uCERN
002875160 700__ $$aVlachoudis, Vasilis$$uCERN
002875160 700__ $$aBernardes, Ana-Paula$$uCERN
002875160 700__ $$aCalviani, Marco$$jORCID:0000-0002-8213-8358$$uCERN
002875160 700__ $$aDanzeca, Salvatore$$jORCID:0000-0001-5517-521X$$uCERN
002875160 773__ $$c1587-1595$$n8$$pIEEE Trans. Nucl. Sci.$$v70$$y2023
002875160 773__ $$wC22-10-03.3
002875160 8564_ $$82483756$$s9639421$$uhttps://cds.cern.ch/record/2875160/files/Electronics_Irradiation_With_Neutrons_at_the_NEAR_Station_of_the_n_TOF_Spallation_Source_at_CERN.pdf$$yFulltext
002875160 960__ $$a13
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002875160 980__ $$aARTICLE
002875160 980__ $$aConferencePaper