CERN Accelerating science

Article
Report number arXiv:2301.13638
Title Charge collection and efficiency measurements of the TJ-Monopix2 DMAPS in 180 nm CMOS technology
Related titleCharge collection and efficiency measurements of the TJ-Monopix2 DMAPS in 180nm CMOS technology
Author(s) Bespin, Christian (Bonn U.) ; Caicedo, Ivan (Bonn U.) ; Dingfelder, Jochen Christian (Bonn U.) ; Hemperek, Tomasz (Bonn U. ; DECTRIS Baden) ; Hirono, Toko (Bonn U. ; DESY) ; Hügging, Fabian (Bonn U.) ; Krüger, Hans (Bonn U.) ; Moustakas, Konstantinos (Bonn U. ; PSI, Villigen) ; Pernegger, Heinz (CERN) ; Riedler, Petra (CERN) Show all 13 authors
Publication 2023
Imprint 2023-01-31
Number of pages 8
Note Conference proceedings for PIXEL2022 conference, submitted to PoS
In: PoS Pixel2022 (2023) pp.080
In: 10th International Workshop on Semiconductor Pixel Detectors for Tracking and Imaging (PIXEL 2022), Santa Fe, USA, 11 - 16 Dec 2022, pp.080
DOI 10.22323/1.420.0080
Subject category physics.ins-det ; Detectors and Experimental Techniques
Abstract Monolithic CMOS pixel detectors have emerged as competitive contenders in the field of high-energy particle physics detectors. By utilizing commercial processes they offer high-volume production of such detectors. A series of prototypes has been designed in a 180nm Tower process with depletion of the sensor material and a column-drain readout architecture. The latest iteration, TJ-Monopix2, features a large 2cm x 2cm matrix consisting of 512 x 512 pixels with 33.04um pitch. A small collection electrode design aims at low power consumption and low noise while the radiation tolerance for high-energy particle detector applications needs extra attention. With a goal to reach radiation tolerance to levels of 10151MeV neqcm2 of NIEL damage a modification of the standard process has been implemented by adding a low-dosed n-type silicon implant across the pixel in order to allow for homogeneous depletion of the sensor volume. Recent lab measurements and beam tests were conducted for unirradiated modules to study electrical characteristics and hit detection efficiency.
Copyright/License © 2023-2024 The author(s) (License: CC-BY-NC-ND-4.0)
preprint: (License: CC BY-NC-ND 4.0)

Corresponding record in: Inspire


 Record created 2023-09-13, last modified 2023-09-13


Fulltext:
document - Download fulltextPDF
2301.13638 - Download fulltextPDF
  • Send to ScienceWise.info