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Article
Title Source Switched Charge-Pump PLLs for High-Dose Radiation Environments
Author(s) Prinzie, Jeffrey (Leuven U.) ; Biereigel, Stefan (CERN) ; Kulis, Szymon (CERN) ; Leitao, Pedro (CERN) ; Moreira, Paulo (CERN)
Publication 2023
Number of pages 6
In: IEEE Trans. Nucl. Sci. 70 (2023) 590-595
In: 2022 IEEE Nuclear and Space Radiation Effects Conference, Provo, Utah, USA, 18 - 23 Jul 2022, pp.590-595
DOI 10.1109/TNS.2022.3223969
Subject category Detectors and Experimental Techniques
Abstract This article presents a radiation tolerant charge-pump phase-locked loop (PLL) with low static phase error variability suitable for high-performance clock systems in high-dose radiation environments. We investigate the use of source switching charge-pump architectures to minimize any voltage- or dose-dependent charge injection and address the limitations of enclosed layout transistors (ELTs) in the conventional drain switched charge-pump. The circuit has been processed in a 65-nm complementary metal–oxide–semiconductor (CMOS) technology and has been experimentally verified with X-rays up to a total ionizing dose of 180 Mrad.
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 ჩანაწერი შექმნილია 2023-05-05, ბოლოს შესწორებულია 2024-04-03