Abstract
| The Low-Power Gigabit Transceiver (lpGBT) is a radiation-tolerant ASIC designed to implement multipurpose high-speed bidirectional serial links in HEP experiments. Having more than 320 programmable registers, the ASIC is highly configurable. Its test must cover a large variety of functionalities which will be validated at three different power-supply voltages, two temperatures and over more than 1000 parameters. As more than 175 000 chips will be produced, optimizing the test duration is also a strong requirement. In this talk, an overview of the lpGBT v1 production test system will be given, challenges will be presented, and performance will be discussed. |