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Title	RD53A chip susceptibility to electromagnetic conducted noise
Author(s)	Pradas, Alvaro (Zaragoza, ITA) ; Arteche, Fernando (Zaragoza, ITA) ; Esteban, Cristina (Zaragoza, ITA) ; Arcega, Francisco Javier (Zaragoza U.) ; Jiménez, Esther (Cantabria Inst. of Phys.) ; Koukola, Dominik (CERN) ; Orfanelli, Stella (CERN) ; Christiansen, Jorgen (CERN)
Publication	SISSA, 2020
Number of pages	5
In:	PoS TWEPP2019 (2020) 064
In:	TWEPP 2019 Topical Workshop on Electronics for Particle Physics, Santiago De Compostela, Spain, 2 - 6 Sep 2019, pp.064
DOI	10.22323/1.370.0064
Subject category	Detectors and Experimental Techniques
Accelerator/Facility, Experiment	CERN LHC ; ATLAS CERN LHC ; CMS
Abstract	The RD53A read-out chip (65 nm CMOS) is a large-scale demonstrator for ATLAS and CMS phase 2 pixel upgrades. It is one of the key elements of the serial powering scheme for the next generation of pixel detectors. The susceptibility of the RD53A chip with respect to external EM noise has an impact on the integration strategies (grounding and shielding schemes) and operating conditions of future Pixel detectors. This paper presents a detailed analysis of the RD53A chip susceptibility to RF conducted disturbances in order to understand and address noise issues of RD53A Chip before the pixel upgrade installation.
Copyright/License	publication: © 2018-2025 The Authors (License: CC-BY-NC-ND-4.0)

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