CERN Accelerating science

Published Articles
Title	Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
Author(s)	García Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Brugger, Markus (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Cononetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Esposito, Luigi (CERN) ; Fernández-Martínez, Pablo (CERN) ; Gilardoni, Simone (CERN) ; Infantino, Angelo (CERN) ; Kastriotou, Maria (CERN) ; Kerboub, Nourdine (CERN) ; Lerner, Giuseppe (CERN) ; Wyrwoll, Vanessa (CERN) ; Ferlet-Cavrois, Véronique (ESTEC, Noordwijk) ; Boatella, César (ESTEC, Noordwijk) ; Javanainen, Arto (Jyvaskyla U.) ; Kettunen, Heikki (Jyvaskyla U.) ; Morilla, Yolanda (CNA, Seville) ; Martín-Holgado, Pedro (CNA, Seville) ; Gaillard, Rémi (Unlisted, FR) ; Wrobel, Frédéric (CEM2, Montpellier) ; Cazzaniga, Carlo (Rutherford) ; Alexandrescu, Dan (Unlisted, FR) ; Glorieux, Maximilien (Unlisted, FR) ; Puchner, Helmut (Unlisted, US)
Publication	2019
Number of pages	8
In:	IEEE Trans. Nucl. Sci. 67 (2019) 345-352
DOI	10.1109/TNS.2019.2951307
Subject category	Accelerators and Storage Rings
Accelerator/Facility, Experiment	CERN CHARM CERN LHC
Abstract	We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to  0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.
Copyright/License	publication: (License: CC-BY-4.0)

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