Home > Radiation damage in p-type EPI silicon pad diodes irradiated with different particle types and fluences |
Report number | AIDA-2020-POSTER-2019-005 |
Title | Radiation damage in p-type EPI silicon pad diodes irradiated with different particle types and fluences |
Author(s) | Gurimskaya, Yana (CERN) ; Mateu, Isidre (CERN) ; Moll, Michael (CERN) ; Dias De Almeida, Pedro (University of Cantabria) ; Fernandez Garcia, Marcos (University of Cantabria) |
Publication | 2019 |
Imprint | 2019-02-20 |
Subject category | Detectors and Experimental Techniques ; 11: Irradiation test facilities |
Submitted by | [email protected] |