CERN Accelerating science

Published Articles
Title	Single event effects in high-energy accelerators
Author(s)	García Alía, Rubén (CERN) ; Brugger, Markus (CERN) ; Danzeca, Salvatore (CERN) ; Cerutti, Francesco (CERN) ; de Carvalho Saraiva, Joao Pedro (CERN) ; Denz, Reiner (CERN) ; Ferrari, Alfredo (CERN) ; Foro, Lionel L (CERN) ; Peronnard, Paul (CERN) ; Røed, Ketil (U. Oslo (main)) ; Secondo, Raffaello (CERN) ; Steckert, Jens (CERN) ; Thurel, Yves (CERN) ; Toccafondo, Iacocpo (CERN) ; Uznanski, Slawosz (CERN)
Publication	2017
Number of pages	11
In:	Semicond. Sci. Technol. 32 (2017) 034003
DOI	10.1088/1361-6641/aa5695
Subject category	Accelerators and Storage Rings
Abstract	The radiation environment encountered at high-energy hadron accelerators strongly differs from the environment relevant for space applications. The mixed-field expected at modern accelerators is composed of charged and neutral hadrons (protons, pions, kaons and neutrons), photons, electrons, positrons and muons, ranging from very low (thermal) energies up to the TeV range. This complex field, which is extensively simulated by Monte Carlo codes (e.g. FLUKA) is due to beam losses in the experimental areas, distributed along the machine (e.g. collimation points) and deriving from the interaction with the residual gas inside the beam pipe. The resulting intensity, energy distribution and proportion of the different particles largely depends on the distance and angle with respect to the interaction point as well as the amount of installed shielding material. Electronics operating in the vicinity of the accelerator will therefore be subject to both cumulative damage from radiation (total ionizing dose, displacement damage) as well as single event effects which can seriously compromise the operation of the machine. This, combined with the extensive use of commercial-off-the-shelf components due to budget, performance and availability reasons, results in the need to carefully characterize the response of the devices and systems to representative radiation conditions.

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