Početna stranica > Quantitative Test of the Evolution of Geant4 Electron Backscattering Simulation |
Article | |
Report number | arXiv:1610.06349 |
Title | Quantitative Test of the Evolution of Geant4 Electron Backscattering Simulation |
Related title | Quantitative Test of the Evolution of Geant4 Electron Backscattering Simulation |
Author(s) | Basaglia, Tullio (CERN) ; Han, Min Cheol (Hanyang U.) ; Hoff, Gabriela (Nova Friburgo Polytechnic Inst.) ; Kim, Chan Hyeong (Hanyang U.) ; Kim, Sung Hun (Hanyang U.) ; Pia, Maria Grazia (INFN, Genoa) ; Saracco, Paolo (INFN, Genoa) |
Publication | 2016 |
Imprint | 20 Oct 2016 |
Number of pages | 17 |
Note | To be published in IEEE Trans. Nucl. Sci |
In: | IEEE Trans. Nucl. Sci. 63 (2016) 2849-2865 |
DOI | 10.1109/TNS.2016.2617834 |
Subject category | Other Fields of Physics |
Abstract | Evolutions of Geant4 code have affected the simulation of electron backscattering with respect to previously published results. Their effects are quantified by analyzing the compatibility of the simulated electron backscattering fraction with a large collection of experimental data for a wide set of physics configuration options available in Geant4. Special emphasis is placed on two electron scattering implementations first released in Geant4 version 10.2: the Goudsmit-Saunderson multiple scattering model and a single Coulomb scattering model based on Mott cross section calculation. The new Goudsmit-Saunderson multiple scattering model appears to perform equally or less accurately than the model implemented in previous Geant4 versions, depending on the electron energy. The new Coulomb scattering model was flawed from a physics point of view, but computationally fast in Geant4 version 10.2; the physics correction released in Geant4 version 10.2p01 severely degrades its computational performance. Evolutions in the Geant4 geometry domain have addressed physics problems observed in electron backscattering simulation in previous publications. |
Copyright/License | arXiv nonexclusive-distrib. 1.0 publication: © 2016-2025 IEEE (License: CC-BY-3.0) |