CERN Accelerating science

Article
Report number	arXiv:0801.4125
Title	Precise half-life measurement of the Si-26 ground state
Related title	Precise half-life measurement of the 26Si ground state
Author(s)	Matea, I. (CENBG, Gradignan) ; Souin, J. (CENBG, Gradignan ; Madrid, Inst. Estructura Materia) ; Aysto, J. (Jyvaskyla U.) ; Blank, B. (CENBG, Gradignan) ; Delahaye, P. (CERN) ; Elomaa, V.V. (Jyvaskyla U.) ; Eronen, T. (Jyvaskyla U.) ; Giovinazzo, J. (CENBG, Gradignan) ; Hager, U. (Jyvaskyla U.) ; Hakala, J. (Jyvaskyla U.) ; Huikari, J. (CENBG, Gradignan) ; Jokinen, A. (Jyvaskyla U.) ; Kankainen, A. (Jyvaskyla U.) ; Moore, I.D. (Jyvaskyla U.) ; Pedroza, J.L. (CENBG, Gradignan) ; Rahaman, S. (Jyvaskyla U.) ; Rissanen, J. (Jyvaskyla U.) ; Ronkainen, J. (Jyvaskyla U.) ; Saastamoinen, A. (Jyvaskyla U.) ; Sonoda, T. (Jyvaskyla U.) ; Weber, C. (Jyvaskyla U.)
Publication	2008
Imprint	29 Jan 2008
Number of pages	7
Note	Comments: 7 pages, 6 figures; submitted to EPJA
In:	Eur. Phys. J. A 37 (2008) pp.151-158 Eur. Phys. J. A 38 (2008) pp.247
DOI	10.1140/epja/i2008-10678-2 10.1140/epja/i2008-10623-5
Subject category	Nuclear Physics
Abstract	The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.

Corresponding record in: Inspire