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Electronics Irradiation With Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN
/ Cecchetto, Matteo (CERN) ; Sacristan Barbero, Mario (CERN) ; Lerner, Giuseppe (CERN) ; García Alía, Rubén (CERN) ; Aguiar, Ygor (CERN) ; Senajova, Dominika (CERN) ; Garcia Infantes, Francisco (CERN) ; Pavon Rodriguez, Jose Antonio (CERN) ; Sabate Gilarte, Marta (CERN) ; Vlachoudis, Vasilis (CERN) et al.
We study the neutron field at the NEAR station of the neutron time-of-flight (n_TOF) facility at CERN, through Monte Carlo simulations, well-characterized static random access memories (SRAMs), and radio-photoluminescence (RPL) dosimeters, with the aim of providing neutrons for electronics irradiation. Particle fluxes and typical quantities relevant for electronics testing were simulated for several test positions at NEAR and compared to those at the CERN high-energy accelerator mixed-field facility (CHARM), highlighting similitudes and differences. [...]
2023 - 9 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1587-1595
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2.
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Analysis of the Radiation Field Generated by 200-MeV Electrons on a Target at the CLEAR Accelerator at CERN
/ Lerner, Giuseppe (CERN) ; Pelissou, Pierre (CERN ; INSA, Toulouse) ; Aguiar, Ygor Q (CERN) ; Sacristan Barbero, Mario (CERN) ; Cecchetto, Matteo (CERN) ; Biłko, Kacper (CERN) ; Coussen, Louise (CERN ; INSA, Toulouse) ; Emriskova, Natalia (CERN) ; García Alía, Rubén (CERN) ; Dyks, Luke (CERN ; Oxford U.) et al.
The radiation showers generated by the interaction of high-energy electrons with matter include neutrons with an energy distribution peaked at the MeV scale, produced via photonuclear reactions, allowing measurements of neutron-induced single-event effects (SEEs) in electronic devices. In this work, we study a setup where the 200-MeV electron beam of the CLEAR accelerator at European Organization for Nuclear Research [Centre Européen pour la Recherche Nucléaire (CERN)] is directed on an aluminum target to produce a radiation field with a large neutron component. [...]
2023 - 8 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1572-1579
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SEE Flux and Spectral Hardness Calibration of Neutron Spallation and Mixed-Field Facilities
/ Cecchetto, Matteo (CERN) ; Fernández-Martínez, Pablo (CERN) ; García Alía, Rubén (CERN) ; Ferraro, Rudy (CERN) ; Danzeca, Salvatore (CERN) ; Wrobel, Frédéric (IES, Montpellier) ; Cazzaniga, Carlo (Daresbury) ; Frost, Christopher D (Daresbury)
The approach of calibrating neutron environments through well-known Single Event Upset (SEU)-based SRAM memories is applied to a neutron spallation and mixed-field facility. Implications on the Soft Error Rate (SER) induced by intermediate energy neutrons are evaluated comparing operational environments, such as ground level and accelerator shielded areas, with those reproducible by facilities. [...]
2019 - 9 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1532-1540
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1532-1540
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4.
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Comparison Between In-flight SEL Measurement and Ground Estimation Using Different Facilities
/ Kerboub, N (CNES, Toulouse ; CERN ; [email protected]) ; Alia, R G (CERN) ; Mekki, J (CNES, Toulouse) ; Bezerra, F (CNES, Toulouse) ; Monteuuis, A (CERN) ; Fernández-Martinez, P (CERN) ; Danzeca, S (CERN) ; Brugger, M (CERN) ; Standarovski, D (CNES, Toulouse) ; Rauch, J (CNES, Toulouse)
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acquired by the CARMEN-3 experiment on-board the JASON-3 satellite (middle earth orbit, 1336 km, 66°) and an estimation using SEE rate calculation approaches from several facilities. A SRAM memory sensitive to single-event latchup (SEL) has been monitored in orbit, and the number of events per day was estimated using monoenergetic data coming from the Kernfysisch Versneller Instituut (protons) and Université Catholique de Louvain (heavy-ions) facilities as well as using mixed-field data coming from the Cern High energy AcceleRator Mixed field (CHARM) facility. [...]
2019 - 7 p.
- Published in : IEEE Trans. Nucl. Sci. 66 (2019) 1541-1547
In : Conference on Radiation and its Effects on Components and Systems, Gothenburg, Sweden, 16 - 21 Sep 2018, pp.1541-1547
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5.
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Radiation Effects on Deep Submicrometer SRAM-based FPGAs under the CERN Mixed-Field Radiation Environment
/ Tsiligiannis, G (CERN) ; Danzeca, S (CERN) ; Garcia-Alia, R (CERN) ; Infantino, A (CERN) ; Lesea, A (Xilinx, San Jose) ; Brugger, M (CERN) ; Masi, A (CERN) ; Gilardoni, S (CERN) ; Saigné, F (IES, Montpellier)
In this paper, the single-event effects on a 28-nm static random access memory-based field-programmable gate array (FPGA) under CERN’s mixed-particle field are analyzed. The methodology followed for CERN electronics radiation hard- ness assurance and the particularities of testing an FPGA under a mixed-particle field are demonstrated. [...]
2018 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 65 (2018) 1511-1518
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Analysis of the Photoneutron Field Near the THz Dump of the CLEAR Accelerator at CERN With SEU Measurements and Simulations
/ Lerner, Giuseppe (CERN) ; Coronetti, Andrea (CERN ; Jyvaskyla U.) ; Kempf, Jean Mael (CERN ; ENSAE, Toulouse) ; Garcia Alia, Ruben (CERN) ; Cerutti, Francesco (CERN) ; Prelipcean, Daniel (CERN ; Munich, Tech. U.) ; Cecchetto, Matteo (CERN) ; Gilardi, Antonio (CERN ; Naples U. ; LBNL, Berkeley) ; Farabolini, Wilfrid (CERN ; Saclay) ; Corsini, Roberto (CERN)
We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Solution Inc. (ISSI) static random access memories (SRAMs). [...]
2022 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1541-1548
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CERN Super Proton Synchrotron Radiation Environment and Related Radiation Hardness Assurance Implications
/ Biłko, Kacper (CERN ; Lab. Hubert Curien, St. Etienne) ; García Alía, Rubén (CERN) ; Di Francesca, Diego (CERN) ; Aguiar, Ygor (CERN) ; Danzeca, Salvatore (CERN) ; Gilardoni, Simone (CERN) ; Girard, Sylvain (Lab. Hubert Curien, St. Etienne) ; Esposito, Luigi Salvatore (CERN) ; Fraser, Matthew Alexander (CERN) ; Mazzola, Giuseppe (CERN) et al.
The super proton synchrotron (SPS) is the second largest accelerator at CERN where protons are accelerated between 16 and 450 GeV/c. Beam losses, leading to the mixed-field radiation of up to MGy magnitude, pose a threat to the reliability of the electronic equipment and polymer materials located in the tunnel and its vicinity. [...]
2023 - 10 p.
- Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.1606-1615
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Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit For LEO Space Applications
/ Secondo, Raffaello (CERN ; IES, Montpellier) ; Alía, Ruben (CERN) ; Peronnard, Paul (CERN) ; Brugger, Markus (CERN) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN) ; Merlenghi, Anne-Sophie (CERN) ; Vaillé, Jean-Roch (IES, Montpellier ; U. Nîmes, Nîmes) ; Dusseau, Laurent (IES, Montpellier)
A single event latchup (SEL) experiment based on commercial static random access memory (SRAM) memories has recently been proposed in the framework of the European Organization for Nuclear Research (CERN) Latchup Experiment and Student Satellite nanosatellite low Earth orbit (LEO) space mission. SEL characterization of three commercial SRAM memories has been carried out at the Paul Scherrer Institut (PSI) facility, using monoenergetic focused proton beams and different acquisition setups. [...]
2017 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 64 (2017) 2107 - 2114
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10.
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Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
/ García Alía, Rubén (CERN) ; Tali, Maris (CERN) ; Brugger, Markus (CERN) ; Cecchetto, Matteo (CERN) ; Cerutti, Francesco (CERN) ; Cononetti, Andrea (CERN) ; Danzeca, Salvatore (CERN) ; Esposito, Luigi (CERN) ; Fernández-Martínez, Pablo (CERN) ; Gilardoni, Simone (CERN) et al.
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65–16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. [...]
2019 - 8 p.
- Published in : IEEE Trans. Nucl. Sci. 67 (2019) 345-352
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