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Design and Characterization of a Radiation-Tolerant Wireless Physical Layer for Control Applications in CERN Particle Accelerators / Scialdone, Antonio (CERN ; IES, Montpellier) ; Ferraro, Rudy (CERN) ; Danzeca, Salvatore (CERN) ; Saigne, Frederic (IES, Montpellier) ; Boch, Jérôme (IES, Montpellier) ; Dilillo, Luigi (IES, Montpellier ; U. Montpellier, L2C) ; Masi, Alessandro (CERN)
The article explores the design and radiation characterization of a wireless physical layer (PHY) specifically tailored for equipment control in harsh radiation environments, such as those in particle accelerators like the large hadron collider (LHC). The PHY, built with commercial-off-the-shelf (COTS), leverages a software-defined radio (SDR), which, compared to dedicated transceivers, provides more flexibility and enables enhanced reliability through mitigation techniques. [...]
2025 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 72 (2025) 1068-1076 Fulltext: PDF; External links: Fulltext; Fulltext

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2023 Compendium of Radiation-Induced Effects for Candidate Particle Accelerator / Ferraro, Rudy (CERN) ; Gkountoumis, Panagiotis (CERN) ; Foucard, Gilles (CERN) ; Ventura, Antonio (CERN) ; Scialdone, Antonio (CERN ; Montpellier U.) ; Zimmaro, Alessandro (CERN ; Montpellier U.) ; Glecer, Bruno (CERN) ; Koseoglou, Sokratis (CERN) ; Botias, Cai Arcos (CERN) ; Masi, Alessandro (CERN) et al.
The sensitivity of a variety of components for particle accelerator electronics has been analyzed against Single Event Effects, Total Ionizing Dose and Displacement Damage. The tested parts include analog, linear, digital, and mixed devices..
2023 - 8 p. - Published in : 10.1109/REDW61050.2023.10265814
In : 2023 IEEE Radiation Effects Data Workshop (REDW 2023): (in conjunction with 2023 NSREC), Kansas City, Missouri, United States, 24 - 28 Jul 2023

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Exploring Radiation-Induced Vulnerabilities in RFICs Through Traditional RF Metrics / Scialdone, Antonio (CERN ; LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Ferraro, Rudy (cern) ; Dilillo, Luigi (LIRMM, Montpellier ; Montpellier U. ; CNRS, France) ; Saigne, Frederic (Montpellier U. ; CNRS, France) ; Boch, Jérôme (CNRS, France ; Montpellier U.) ; Masi, Alessandro (CERN) ; Danzeca, Salvatore (CERN)
This article describes how to analyze radiation-induced effects using traditional radio-frequency (RF) metrics in RF integrated circuits (RFICs) to be used in the implementation of software-defined radios (SDRs). The impacts of total ionizing dose (TID) and single-event effects (SEEs) on the device characteristics are shown and their consequences for an SDR are discussed. [...]
2023 - 8 p. - Published in : IEEE Trans. Nucl. Sci.
Fulltext: PDF;
In : European Conference on Radiation and its Effects on Components and Systems, Venice, Italy, 3 - 7 Oct 2022, pp.2068-2075

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FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits / Scialdone, Antonio (CERN ; Polytech. Turin) ; Ferraro, Rudy (CERN) ; Garcia Alia, Ruben (CERN) ; Sterpone, Luca (Polytech. Turin) ; Danzeca, Salvatore (CERN) ; Masi, Alessandro (CERN)
When studying the behavior of a field programmable gate array (FPGA) under radiation, the most commonly used methodology consists in evaluating the single-event effect (SEE) cross section of its elements individually. However, this method does not allow the estimation of the device failure rate when using a custom design. [...]
2022 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 69 (2022) 1633-1641 Fulltext: PDF;

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