| Preprint | |
| Report number | CAEP-0106 |
| Title | A study of radiation hardness screening techniques of integrated circuits |
| Author(s) | Wang Xu Li |
| Publication | 2002 |
| Imprint | 2002 |
| Number of pages | 8 |
| Subject category | Detectors and Experimental Techniques |
| Abstract | The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-the-art of the screening technology |
Record created 2004-06-30, last modified 2009-07-13
