| Hauptseite > Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films |
| Article | |
| Report number | SLAC-REPRINT-2003-014 |
| Title | Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films |
| Author(s) | Tamura, N ; MacDowell, A A ; Spolenak, R ; Valek, B C ; Brown, W L ; Celestre, R S ; Padmore, H A ; Batterman, B W ; Patel, J R |
| Affiliation | (SLAC, SSRL) |
| Publication | 2003 |
| Imprint | 2003 |
| In: | J. Synchrotron Radiat. 10 (2003) pp.137-143 |