002913173 001__ 2913173
002913173 003__ SzGeCERN
002913173 005__ 20241024131540.0
002913173 0247_ $$2DOI$$9IEEE$$a10.1109/TNS.2024.3396737
002913173 0248_ $$aoai:cds.cern.ch:2913173$$pcerncds:FULLTEXT$$pcerncds:CERN:FULLTEXT$$pcerncds:CERN
002913173 035__ $$9https://inspirehep.net/api/oai2d$$aoai:inspirehep.net:2820589$$d2024-10-09T11:56:40Z$$h2024-10-11T04:00:13Z$$mmarcxml
002913173 035__ $$9Inspire$$a2820589
002913173 041__ $$aeng
002913173 100__ $$aBarbero, Mario Sacristán$$jORCID:0000-0002-8903-1449$$uCERN$$uIES, Montpellier$$vInstitute de Éléctronique et des Systèmes, Université de Montpellier, Montpellier, France
002913173 245__ $$9IEEE$$aCharacterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
002913173 260__ $$c2024
002913173 300__ $$a8 p
002913173 520__ $$9IEEE$$aUltrahigh-energy (UHE) (>5 GeV/n) heavy ion beams exhibit different properties when compared to standard and high-energy ion beams. Most notably, fragmentation is a fundamental feature of the beam that may have important implications for electronics testing given the ultrahigh energies and, hence, ranges, preserved by the fragments. In this work, both the primary lead ion beam, available in the Conseil Européen pour la Recherche Nucléaire (CERN) north area (NA), and its fragments are characterized by means of solid-state detectors. This input is later used to improve the measurements of single-event effects (SEEs) in commercial components with this beam. Moreover, the energy deposition distribution in the solid-state detectors is compared to that obtained with Monte Carlo simulations.
002913173 540__ $$3publication$$aCC-BY-4.0$$fCERN-RP: IEEE$$uhttps://creativecommons.org/licenses/by/4.0/
002913173 542__ $$3publication$$dThe Authors$$g2024
002913173 65017 $$2SzGeCERN$$aDetectors and Experimental Techniques
002913173 6531_ $$9author$$aIons
002913173 6531_ $$9author$$aTesting
002913173 6531_ $$9author$$aSilicon
002913173 6531_ $$9author$$aDetectors
002913173 6531_ $$9author$$aKinetic energy
002913173 6531_ $$9author$$aIon beams
002913173 6531_ $$9author$$aParticle beams
002913173 6531_ $$9author$$aIon Beam
002913173 6531_ $$9author$$aHeavy Ions
002913173 6531_ $$9author$$aSingle Event Effects
002913173 6531_ $$9author$$aMonte Carlo Simulation
002913173 6531_ $$9author$$aNorth Of Area
002913173 6531_ $$9author$$aEnergy Deposition
002913173 6531_ $$9author$$aPrimary Beam
002913173 6531_ $$9author$$aPrimary Ion
002913173 6531_ $$9author$$aSolid-state Detector
002913173 6531_ $$9author$$aHigh-energy Ions
002913173 6531_ $$9author$$aPrimary Ion Beam
002913173 6531_ $$9author$$aCross-sectional
002913173 6531_ $$9author$$aKinetic Energy
002913173 6531_ $$9author$$aEffects Of Radiation
002913173 6531_ $$9author$$aBeamline
002913173 6531_ $$9author$$aIon Flux
002913173 6531_ $$9author$$aBeam Intensity
002913173 6531_ $$9author$$aEuropean Space Agency
002913173 6531_ $$9author$$aLinear Energy Transfer
002913173 6531_ $$9author$$aStatic Random Access Memory
002913173 6531_ $$9author$$aGalactic Cosmic Rays
002913173 6531_ $$9author$$aGermanium Detector
002913173 6531_ $$9author$$aMaterial Length
002913173 6531_ $$9author$$aPrimary Field
002913173 6531_ $$9author$$aBeam Flux
002913173 6531_ $$9author$$aNucleon
002913173 6531_ $$9author$$aInelastic Collisions
002913173 6531_ $$9author$$aSpallation
002913173 6531_ $$9author$$aBeam fragmentation
002913173 6531_ $$9author$$aFLUktuierende KAskade (FLUKA)
002913173 6531_ $$9author$$aheavy-ion beam
002913173 6531_ $$9author$$aMonte Carlo simulations
002913173 6531_ $$9author$$aRADiation facility Network for the EXploration of effects for indusTry and research (RADNEXT)
002913173 6531_ $$9author$$asingle-event effects (SEEs)
002913173 6531_ $$9author$$asolid-state silicon detectors
002913173 6531_ $$9author$$asuper proton synchrotron (SPS) north area (NA)
002913173 6531_ $$9author$$astatic random access memory (SRAM) memories
002913173 6531_ $$9author$$aultrahigh-energy (UHE) beam
002913173 690C_ $$aARTICLE
002913173 690C_ $$aCERN
002913173 700__ $$aSlipukhin, Ivan$$jORCID:0000-0003-3949-5824$$uIES, Montpellier$$uCERN$$vInstitute de Éléctronique et des Systèmes, Université de Montpellier, Montpellier, France
002913173 700__ $$aCecchetto, Matteo$$jORCID:0000-0002-0557-4586$$uCERN
002913173 700__ $$aPrelipcean, Daniel$$jORCID:0000-0002-4855-194X$$uCERN
002913173 700__ $$aAguiar, Ygor$$jORCID:0000-0003-4416-2610$$uCERN
002913173 700__ $$aBilko, Kacper$$jORCID:0000-0002-0825-8255$$uCERN
002913173 700__ $$aEmriskova, Natalia$$jORCID:0000-0002-5834-8515$$uCERN
002913173 700__ $$aWaets, Andreas$$uCERN
002913173 700__ $$aCoronetti, Andrea$$jORCID:0000-0001-8840-7400$$uCERN
002913173 700__ $$aKastriotou, Maria$$jORCID:0000-0003-1010-2396$$uRutherford Appleton Laboratory
002913173 700__ $$aCazzaniga, Carlo$$jORCID:0000-0002-3110-0253$$uRutherford Appleton Laboratory
002913173 700__ $$aDodd, Torran$$uRutherford Appleton Laboratory
002913173 700__ $$aSaigné, Frédéric$$uIES, Montpellier
002913173 700__ $$aPouget, Vincent$$jORCID:0000-0001-6126-6708$$uIES, Montpellier
002913173 700__ $$aGarcía Alía, Rubén$$jORCID:0000-0001-8030-1804$$uCERN
002913173 773__ $$c1557-1564$$n8$$pIEEE Trans. Nucl. Sci.$$v71$$y2024
002913173 773__ $$wC23-09-25.6
002913173 8564_ $$82563722$$s11077044$$uhttp://cds.cern.ch/record/2913173/files/document.pdf$$yFulltext
002913173 960__ $$a13
002913173 962__ $$b2806405$$k1557-1564$$ntoulouse202320925
002913173 980__ $$aARTICLE
002913173 980__ $$aConferencePaper