 | Data, and pre- and post-fit yields for TopCR, TopVR, and SR as a function of leading photon \pT. The error bars on data indicate its statistical uncertainty. The bottom panel shows the ratio of the data to the post-fit yield (black points) and the ratio of the pre-fit yield to the post-fit yield (solid line) for each of the regions. The uncertainty band includes both the statistical and systematic uncertainties obtained from the fit. The $tt\gamma$ background is scaled by the normalization factor $\alpha_{tt\gamma}$, and the $W(\ell\nu)\gamma\gamma$ prediction, by the signal strength $\mu$. Background contributions from pileup in TopCR and TopVR are neglected. |