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Article
Report number	arXiv:1705.09481 ; FERMILAB-PUB-17-267-CD
Title	Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives
Related title	Microscopic simulation of xenon-based optical TPCs in the presence of molecular additives
Author(s)	Azevedo, C.D.R. (Aveiro U.) ; González-Díaz, D. (CERN ; Santiago de Compostela U., IGFAE) ; Biagi, S.F. (Uludag U.) ; Oliveira, C.A.B. (LBNL, Berkeley) ; Henriques, C.A.O. (Coimbra U.) ; Escada, J. (Coimbra U.) ; Monrabal, F. (Texas U., Arlington) ; Gómez-Cadenas, J.J. (Valencia U., IFIC) ; Álvarez, V. (Valencia U., IFIC) ; Benlloch-Rodríguez, J.M. (Valencia U., IFIC) ; Borges, F.I.G.M. (Coimbra U.) ; Botas, A. (Valencia U., IFIC) ; Cárcel, S. (Valencia U., IFIC) ; Carrión, J.V. (Valencia U., IFIC) ; Cebrián, S. (Zaragoza U.) ; Conde, C.A.N. (Coimbra U.) ; Díaz, J. (Valencia U., IFIC) ; Diesburg, M. (Fermilab) ; Esteve, R. (Valencia, Polytechnic U.) ; Felkai, R. (Valencia U., IFIC) ; Fernandes, L.M.P. (Coimbra U.) ; Ferrario, P. (Valencia U., IFIC) ; Ferreira, A.L. (Aveiro U.) ; Freitas, E.D.C. (LBNL, Berkeley) ; Goldschmidt, A. (LBNL, Berkeley) ; Gutiérrez, R.M. (Antonio Narino U.) ; Hauptman, J. (Iowa State U.) ; Hernandez, A.I. (Santiago de Compostela U., IGFAE) ; Hernando Morata, J.A. (Santiago de Compostela U., IGFAE) ; Herrero, V. (Texas U., Arlington) ; Jones, B.J.P. (Texas U., Arlington) ; Labarga, L. (Madrid, IFT) ; Laing, A. (Fermilab) ; Lebrun, P. (Fermilab) ; Liubarsky, I. (Valencia U., IFIC) ; Lopez-March, N. (Valencia U., IFIC) ; Losada, M. (Antonio Narino U.) ; Martín-Albo, J. (Valencia U., IFIC) ; Martínez-Lema, G. (Valencia U., IFIC) ; Martínez, A. (Valencia U., IFIC) ; McDonald, A.D. (Texas U., Arlington) ; Monteiro, C.M.B. (Coimbra U.) ; Mora, F.J. (Valencia U., IFIC) ; Moutinho, L.M. (Aveiro U.) ; Muñoz Vidal, J. (Valencia U., IFIC) ; Musti, M. (Valencia U., IFIC) ; Nebot-Guinot, M. (Valencia U., IFIC) ; Novella, P. (Valencia U., IFIC) ; Nygren, D. (Fermilab) ; Palmeiro, B. (Valencia U., IFIC) ; Para, A. (Fermilab) ; Pérez, J. (Madrid, IFT) ; Querol, M. (Valencia U., IFIC) ; Renner, J. (Valencia U., IFIC) ; Ripoll, L. (Girona U.) ; Rodríguez, J. (Coimbra U.) ; Rogers, L. (Texas U., Arlington) ; Santos, F.P. (Coimbra U.) ; dos Santos, J.M.F. (Coimbra U.) ; Serra, L. (Valencia U., IFIC) ; Shuman, D. (LBNL, Berkeley) ; Simón, A. (Valencia U., IFIC) ; Sofka, C. (Texas A-M) ; Sorel, M. (Valencia, Polytechnic U.) ; Stiegler, T. (Texas A-M) ; Toledo, J.F. (Aveiro U.) ; Torrent, J. (Girona U.) ; Tsamalaidze, Z. (Dubna, JINR) ; Veloso, J.F.C.A. (Aveiro U.) ; Webb, R. (Texas A-M) ; White, J.T. (Texas A-M) ; Yahlali, N. (Valencia U., IFIC)
Publication	2018-01-01
Imprint	2017-05-26
Number of pages	16
In:	Nucl. Instrum. Methods Phys. Res., A 877 (2018) 157-172
DOI	10.1016/j.nima.2017.08.049
Subject category	physics.ins-det ; Detectors and Experimental Techniques
Abstract	We introduce a simulation framework for the transport of high and low energy electrons in xenon-based gaseous optical time projection chambers (OTPCs). The simulation relies on elementary cross sections (electron-atom and electron-molecule) and incorporates, in order to compute the gas scintillation, the reaction/quenching rates (atom-atom and atom-molecule) of the first 41 excited states of xenon and the relevant associated excimers, together with their radiative cascade. The results compare positively with observations made in pure xenon and its mixtures with CO$_2$ and CF$_4$ in a range of pressures from 0.1 to 10 bar. This work sheds some light on the elementary processes responsible for the primary and secondary xenon-scintillation mechanisms in the presence of additives, that are of interest to the OTPC technology.
Copyright/License	Elsevier B.V. (License: arXiv nonexclusive-distrib. 1.0)

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